Related papers: Quadrature phase interferometer for high resolutio…
The frequency-dependent amplitude and phase in piezoresponse force microscopy (PFM) measurements are shown to be a consequence of the Euler-Bernoulli (EB) dynamics of atomic force microscope (AFM) cantilever beams used to make the…
We discuss the use of atom interferometry as a tool to search for Dark Matter (DM) composed of ultra-light scalar fields. Previous work on ultra-light DM detection using accelerometers has considered the possibility of equivalence principle…
The use of Raman laser generated by modulation for light-pulse atom interferometer allows to have a laser system more compact and robust. However, the additional laser frequencies generated can perturb the atom interferometer. In this…
Magnetic force microscopy (MFM) is a well-established technique in scanning probe microscopy that allows for the imaging of magnetic samples with a spatial resolution of tens of nm and stray fields down to the mT range. The spatial…
Atomic Force Microscopy - Infrared (AFM-IR) spectroscopy allows spectroscopic studies in the mid-infrared spectral region with a spatial resolution better than 50 nm. We show that the high spatial resolution can be used to perform…
Interferometers play a crucial role in high-precision displacement measurement such as gravitational-wave detection. Conventional interferometer designs require accurate laser alignment, including the laser pointing and the waist position,…
Conventional dynamic atomic force microscopy (AFM) can be extended to bimodal and multimodal AFM in which the cantilever is simultaneously excited at two ore more resonance frequencies. Such excitation schemes result in one additional…
A spreadsheet algorithm is given for the atomic force microscope that accounts for non-linear behavior in the deflection of the cantilever and in the photo-diode response. In addition, the data analysis algorithm takes into account…
In atomic force microscopy (AFM), the exchange and alignment of the AFM cantilever with respect to the optical beam and position-sensitive detector (PSD) are often performed manually. This process is tedious and time-consuming and sometimes…
The amplification obtained using weak values is quantified through a detailed investigation of the signal to noise ratio for an optical beam deflection measurement. We show that for a given deflection, input power and beam radius, the use…
Quality factor plays a fundamental role in dynamic mode atomic force microscopy. We present a technique to modify the quality factor of an atomic force microscopy cantilever within a Fabry-P\'erot optical interferometer. The experimental…
Measuring the amplitude and the absolute phase of a monochromatic microwave field at a specific point of space and time has many potential applications, including precise qubit rotations and wavelength quantum teleportation. Here we show…
Multiarm interferometers can enhance measurement precision and provide multiparameter capability to the measurement. Their realisation requires multiport beam splitters, which has been a long-standing challenge in free-space and integrated…
We discuss the influence of external forces on the motion of the tip in dynamic atomic force microscopy (AFM). First, a compact solution for the steady-state problem is derived employing a Fourier approach. Founding on this solution, we…
We demonstrate an atom interferometer that uses a laser-cooled continuous beam of $^{87}$Rb atoms having velocities of 10--20 m/s. With spatially separated Raman beams to coherently manipulate the atomic wave packets, Mach--Zehnder…
X-ray free electron lasers (XFELs) generate sequences of ultra-short, spatially coherent pulses of x-ray radiation. We propose the diffraction focusing spectrometer (DFS), which is able to measure the whole energy spectrum of the radiation…
Commercial atomic force microscopes usually use a four-segmented photodiode to detect the motion of the cantilever via laser beam deflection. This read-out technique enables to measure bending and torsion of the cantilever separately. A…
Achieving precise and adjustable control over laser frequency is an essential requirement in numerous applications such as precision spectroscopy, quantum control, and sensing. In many such applications it is desired to stabilize a laser…
Angular filter refractometry is an optical diagnostic that measures absolute contours of line-integrated density gradient by placing a filter with alternating opaque and transparent zones in the focal plane of a probe beam, which produce…
Atomic force microscopy (AFM) is an analytical surface characterization tool which can reveal a sample's topography with high spatial resolution while simultaneously probing tip-sample interactions. Local measurement of chemical properties…