Related papers: Quadrature phase interferometer for high resolutio…
Atomic force microscopy (AFM) is a well-known tool for studying surface roughness and to collect depth information about features on the top atomic layer of samples. By combining secondary ion mass spectroscopy (SIMS) with focused ion beam…
One of the main residual limitations of inertial sensors based on atom interferometry stems from laser beam distortions, which cause parasitic phase shifts and non-homogeneous matter-light couplings. Here we present numerical simulations,…
An interferometer has been used to measure the surface profile of generic object. Frequency scanning interferometry has been employed to provide unambiguous phase readings, to suppress etalon fringes, and to supersede phase-shifting. The…
The force sensor is key to the performance of atomic force microscopy (AFM). Nowadays, most AFMs use micro-machined force sensors made from silicon, but piezoelectric quartz sensors are applied at an increasing rate, mainly in vacuum. These…
A magnetic field gradient applied to an atom interferometer induces a $M$-dependent phase shift which results in a series of decays and revivals of the fringe visibility. Using our lithium atom interferometer based on Bragg laser…
Diffraction of atoms by laser is a very important tool for matter wave optics. Although this process is well understood, the phase shifts induced by this diffraction process are not well known. In this paper, we make analytic calculations…
Micromechanical transducers such as cantilevers for AFM often rely on optical readout methods that require illumination of a specific region of the microstructure. Here we explore and exploit the diffraction effects that have been…
A simple, low-cost millimeter-wave (70 GHz) interferometer with a phase accuracy better than plus or minur 2 degrees, and a response time of 10 ns is described. The simplicity of this interferometer makes it ideal for measurement of…
Amplitude-modulation atomic force microscopy (AM-AFM) measures nanoscale surface structures by detecting changes in the cantilever oscillation amplitude, contributing to materials research. AM-AFM can non-destructively observe fragile…
We report on the design of an all-mirror wavefront-division interferometer capable of spectroscopic studies across multiple spectral ranges$\unicode{x2013}$from the plasma frequencies of metals to terahertz wavelengths and beyond. The…
Time-domain thermoreflectance (TDTR) and frequency-domain thermoreflectance (FDTR) have been widely used for non-contact measurement of anisotropic thermal conductivity of materials with high spatial resolution. However, the requirement of…
We demonstrate the application of Atomic Force Microscopy (AFM) based optical force microscopy to map the optical near-fields with nanometer resolution, limited only by the AFM probe geometry. We map the electric field distributions of…
The measurement of the silicon lattice parameter by a separate-crystal triple-Laue x-ray interferometer is a key step for the kilogram realisation by counting atoms. Since the measurement accuracy is approaching nine significant digits, a…
We realize and model a Rydberg-state atom interferometer for measurement of phase and intensity of radio-frequency (RF) electromagnetic waves. A phase reference is supplied to the atoms via a modulated laser beam, enabling atomic…
Dynamic-mode atomic force microscopy (AFM) in liquid remains complicated due to the strong viscous damping of the cantilever resonance. Here we show that a high-quality resonance (Q>20) can be achieved in aqueous solution by attaching a…
The exquisite precision of atom interferometers has sparked the interest of a large community for use cases ranging from fundamental physics to geodesy and inertial navigation. However, their practical use for onboard applications is still…
Frequency dependent dynamic behavior in Piezoresponse Force Microscopy (PFM) implemented on a beam-deflection atomic force microscope (AFM) is analyzed using a combination of modeling and experimental measurements. The PFM signal comprises…
This article reviews the progress of atomic force microscopy (AFM) in ultra-high vacuum, starting with its invention and covering most of the recent developments. Today, dynamic force microscopy allows to image surfaces of conductors…
We describe an atom interferometer to study the coherence of atoms reflected from an evanescent wave mirror. The interferometer is sensitive to the loss of phase coherence induced by the defects in the mirror. The results are consistent…
We present new techniques for inertial-sensing atom interferometers which produce multiple phase measurements per experimental cycle. With these techniques, we realize two types of multiport measurements, namely quadrature phase detection…