Related papers: Quadrature phase interferometer for high resolutio…
Magnetic force microscopy (MFM) allows one to image the domain structure of ferromagnetic samples by probing the dipole forces between a magnetic probe tip and a magnetic sample. The magnetic domain structure of the sample depends on the…
Atomic force microscopy (AFM) has been constantly supporting nanosciences and nanotechnologies for over 30 years, being present in many fields from condensed matter physics to biology. It enables measuring very weak forces at the nanoscale,…
We present here an analysis of the sensitivity of a time-domain atomic interferometer to the phase noise of the lasers used to manipulate the atomic wave-packets. The sensitivity function is calculated in the case of a three pulse…
Measuring the dispersion of photonic devices with small dispersion-length products is challenging due to the phase-sensitive, and alignment-intensive nature of conventional methods. In this letter, we demonstrate a quantum technique to…
The Transient Fluctuation Theorem is used to calibrate an Atomic Force Microscope by measuring the fluctuations of the work performed by a time dependent force applied between a collo{\"i}dal probe and the surface. From this measure one can…
Mechanical properties of biological samples have been imaged with a \textit{Force Feedback Microscope}. Force, force gradient and dissipation are measured simultaneously and quantitatively, merely knowing the AFM cantilever spring constant.…
A dual-excitation method for resonant-frequency tracking in scanning probe microscopy based on amplitude detection is developed. This method allows the cantilever to be operated at or near resonance for techniques where standard phase…
Quantifying the tip-sample interaction at the nanoscale in Amplitude Modulation mode AFM is challenging, especially when measuring in liquids. Here, we derive formulas for the tip-sample conservative and dissipative interactions and…
In this paper, we describe the principle of a multi-aperture interferometer that uses a phase-shifting technique and is suitable for quick, snapshot imaging of astrophysical objects at extreme angular resolution through Fourier inversion. A…
A coherent, short-length reference arm reflectometer, which utilizes a 76-MHz repetition rate mode-locked fiber laser, was investigated experimentally for long fiber links (> 10 km). The reflectometer combines the advantages of optical…
The interaction of Na atoms with a surface was probed by inserting a nanofabricated material grating into one arm of an atom interferometer (IFM). This technique permits a direct measurement of the change in phase and coherence of matter…
We present a comprehensive method for visualisation and quantification of the magnetic stray field of magnetic force microscopy (MFM) probes, applied to the particular case of custom-made multi-layered probes with controllable high/low…
Atomic force microscopy (AFM) is widely used to measure surface topography of solid, soft, and living matter at the nanoscale. Moreover, by mapping forces as a function of distance to the surface, AFM can provide a wealth of information…
Coherent interactions between electromagnetic and matter waves lie at the heart of quantum science and technology. However, the diffraction nature of light has limited the scalability of many atom-light based quantum systems. Here, we use…
Time-domain interferometry is an important principle in Fourier transform (FT) and nonlinear femto- to attosecond spectroscopy. To optimize the resolution and sensitivity of this approach, various interferometer stabilization schemes have…
Atomic-resolution imaging on molten metal/solid interfaces at temperatures above 200 {\deg}C was achieved using a high-temperature, high-speed atomic force microscope (AFM) equipped with a qPlus sensor. A tip-scanning high-speed Quadpod…
In a previous work, we designed a compact atom interferometer to measure homogeneous constant forces guiding the arms via shortcuts to adiabatic paths. Within this scheme we drive the atom by moving spin-dependent traps, and design a force…
A methodology is introduced that enables an absolute, quantum-limited measurement of sub-wavelength interferometric displacements. The technique utilizes a high-frequency optical path modulation within an interferometer operated in a…
Tapping mode atomic force microscopy (AFM), also known as amplitude modulated (AM) or AC mode, is a proven, reliable and gentle imaging mode with widespread applications. Over the several decades that tapping mode has been in use,…
Light pulse atom interferometers (AIFs) are exquisite quantum probes of spatial inhomogeneity and gravitational curvature. Moreover, detailed measurement and calibration are necessary prerequisites for very-long-baseline atom interferometry…