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Related papers: EUV induced defects on few-layer graphene

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Oxygen molecules are found to exhibit non-negligible reactivity with graphene under strong light irradiation in the presence of water. The reaction is triggered by the laser Raman spectroscopy measurement itself, and the D band (ca. 1340…

Materials Science · Physics 2013-11-15 Nobuhiko Mitoma , Ryo Nouchi , Katsumi Tanigaki

We present new calculations of the evolving UV background out to the epoch of cosmological reionization and make predictions for the amount of GeV gamma-ray attenuation by electron-positron pair production. Our results are based on recent…

Cosmology and Nongalactic Astrophysics · Physics 2015-05-13 Rudy C. Gilmore , Piero Madau , Joel R. Primack , Rachel S. Somerville , Francesco Haardt

Broadening of the Raman scattering (RS) spectra was studied in monolayer graphene samples irradiated with various dose of ions followed by annealing of radiation damage at different temperatures. It is shown that the width {\Gamma} (full…

Mesoscale and Nanoscale Physics · Physics 2019-12-13 I. Shlimak , A. Butenko , E. Kogan , M. Kaveh

We have used a combination of numerical modeling and experiments to study carbon etching in the presence of a hydrogen plasma. We model the evolution of a low density EUV-induced plasma during and after the EUV pulse to obtain the energy…

Graphene is considered to be plasmon active only up to the infrared based on combined tight binding model and random phase approximation calculations. Here we show that the optical properties of graphene as measured by ellipsometry and…

Mesoscale and Nanoscale Physics · Physics 2014-04-28 Philipp Lange , Günter Kewes , Nikolai Severin , Oliver Benson , Jürgen P. Rabe

Although defects on graphene can degrade electron transport and its ability for use as a protection layer, they can also be helpful to tailor the local properties or activate new sites for particular adsorbates. Here, carbon vacancy defects…

Materials Science · Physics 2018-05-23 Tianbai Li , Jory A. Yarmoff

Controlled defect creation is a prerequisite for the detailed study of disorder effects in materials. Here, we irradiate a graphene/Ir(111)-interface with low-energy Ar+ to study the induced structural changes. Combining computer…

Materials Science · Physics 2013-11-01 E. H. Åhlgren , S. K. Hämäläinen , O. Lehtinen , P. Liljeroth , J. Kotakoski

X-ray photoelectron spectroscopy of graphene is important both for its characterization and as a model for other carbon materials. Despite great recent interest, the intrinsic photoemission of its single layer has not been unambiguously…

Controlled modification of graphene properties is essential for its proposed electronic applications. Here we describe a possibility of tuning electrical properties of graphene via electron beam irradiation. We show that by controlling the…

Materials Science · Physics 2015-10-28 G. Liu , D. Teweldebrhan , A. A. Balandin

The mechanical integrity of composite materials depends primarily on the interface strength and the defect density of the reinforcement which is the provider of enhanced strength and stiffness. In the case of graphene/ polymer…

Chemical, mechanical, thermal and/or electronic properties of bulk or low-dimensional materials can be engineered by introducing structural defects to form novel functionalities. When using particles irradiation, these defects can be…

Materials Science · Physics 2022-02-07 L. Basta , A. Moscardini , S. Veronesi , F. Bianco

Raman Spectroscopy is able to probe disorder in graphene through defect-activated peaks. It is of great interest to link these features to the nature of disorder. Here we present a detailed analysis of the Raman spectra of graphene…

Mesoscale and Nanoscale Physics · Physics 2012-07-10 Axel Eckmann , Alexandre Felten , Artem Mishchenko , Liam Britnell , Ralph Krupke , Kostya S. Novoselov , Cinzia Casiraghi

The new EUV Lithography tools for IC High Volume Manufacture at 22nm make use of EUV radiation at \lambda = 13.5nm. High power Laser (LPP) and Discharge (DPP)EUV light sources are based on Sn plasmas for the optimum conversion of electrical…

Materials Science · Physics 2010-03-22 Valentino Rigato

We study the interaction of electromagnetic (EM) radiation with single-layer graphene and a stack of parallel graphene sheets at arbitrary angles of incidence. It is found that the behavior is qualitatively different for transverse magnetic…

Mesoscale and Nanoscale Physics · Physics 2013-10-31 Yuliy V. Bludov , Nuno M. R. Peres , Mikhail I. Vasilevskiy

We report an experimental Raman study of few-layer graphene after chemical doping achieved by a plasma process in CHF$_3$ gas. A systematic reduction of both the splitting and the area of the 2D band is observed with increasing the doping…

Mesoscale and Nanoscale Physics · Physics 2011-06-07 Matteo Bruna , Stefano Borini

In the past years, EUV lithography scanner systems have entered High-Volume Manufacturing for state-of-the-art Integrated Circuits (IC), with critical dimensions down to 10 nm. This technology uses 13.5 nm EUV radiation, which is shaped and…

Graphene has been recognized as a promising gas sensing material. The response of graphene-based sensors can be radically improved by introducing defects in graphene using, e. g., metal or metal oxide nanoparticles. We have functionalised…

Molecular contamination of a grazing incidence collector for extreme ultraviolet (EUV) lithography was experimentally studied. A carbon film was found to have grown under irradiation from a pulsed tin plasma discharge. Our studies show that…

Materials Science · Physics 2015-06-18 A Dolgov , D Lopaev , C J Lee , E Zoethout , V. Medvedev , O Yakushev , F Bijkerk

Inorganic molecular materials such as tin oxo cages are a promising generation of photoresists compatible with the demands of the recently developed Extreme UltraViolet (EUV) lithography technology. Therefore, a detailed understanding of…

We present the results of spectroscopic measurements in the extreme ultraviolet (EUV) regime (7-17 nm) of molten tin microdroplets illuminated by a high-intensity 3-J, 60-ns Nd:YAG laser pulse. The strong 13.5 nm emission from this…

Atomic Physics · Physics 2018-01-29 F. Torretti , R. Schupp , D. Kurilovich , A. Bayerle , J. Scheers , W. Ubachs , R. Hoekstra , O. O. Versolato