Related papers: Optical identification of crystal defects in CCD m…
With the rapid growth in the semiconductor industry, it is becoming critical to detect and classify increasingly smaller patterned defects. Recently machine learning, including deep learning, has come to aid in this endeavor in a big way.…
We report on ultrasonic imaging in a random heterogeneous medium. The goal is to detect flaws embedded deeply into a polycrystalline material. A 64-element array of piezoelectric transmitters/receivers at a central frequency of 5 MHz is…
Surface defect inspection based on machine vision is often affected by uneven illumination. In order to improve the inspection rate of surface defects inspection under uneven illumination condition, this paper proposes a method for…
We report the first study of the dynamics of point defects, mono and di-vacancies, in a confined 2-D colloidal crystal in real space and time using digital video microscopy. The defects are introduced by manipulating individual particles…
Defect detection in the manufacturing industry is of utmost importance for product quality inspection. Recently, optical defect detection has been investigated as an anomaly detection using different deep learning methods. However, the…
The rise of deep learning has introduced a transformative era in the field of image processing, particularly in the context of computed tomography. Deep learning has made a significant contribution to the field of industrial Computed…
Cold dark matter (CDM) constitutes most of the matter in the Universe. The interplay between dark and luminous matter in dense cosmic environments like galaxy clusters is studied theoretically using cosmological simulations. Observed…
Two parameters are developed to analyze the CCD images from ground-based and/or space telescopes. The first parameter, deduced from the intensity profile of the object sharp, is useful to resolve stars and hot pixels. The second parameter…
We present a reduction pipeline for CCD (charge-coupled device) images which was built to search for variable sources in highly crowded fields like the M31 bulge and to handle extensive databases due to large time series. We describe all…
A previously unknown effect-giant spatial redistribution of the electric field strength in a crystal under illumination of the structure - was discovered and investigated in real photoresistors on high-resistivity (semi-insulating)…
Czochralski-grown silicon crystals were studied by the techniques of the low-angle mid-IR-light scattering and electron-beam-induced current. The large-scale accumulations of electrically-active impurities detected in this material were…
The purpose of this project is to investigate the use of charge couple devices (CCDs) to detect electrons directly. This can be done in transmission electron microscopy (TEM) for electrons over 100 KeV, but for space plasma instruments,…
We describe the flattening of scientific CCD imaging data using a dome flat field system. The system uses light emitting diodes (LEDs) to illuminate a carefully constructed dome flat field screen. LEDs have several advantages over more…
The Silicon Photomultiplier (SiPM) is a promising photo-detector for a variety of applications. However, the high dark count rate (DCR) of the SiPM is still a contemporary problem. Decreasing the DCR would significantly broaden the range of…
If a component of dark matter has dissipative interactions, it can cool to form compact astrophysical objects with higher density than that of conventional cold dark matter (sub)haloes. Dark matter annihilations might then appear as point…
In the context of the relationship between physics of cosmological dark matter and symmetry of elementary particles a wide list of dark matter candidates is possible. New symmetries provide stability of different new particles and their…
In this paper we consider two problems in diagnostics of trapped ion crystals in which an analysis of the ions' collective oscillatory motion yield potentially useful results. When one of the ions in a linear crystal undergoes a collision,…
Traditional studies of stellar clusters in external galaxies use surface photometry and therefore focus on systems that are still bright and compact enough to be separated from the stellar background. Consequently, the latter stages of…
To coupe with the difficulties in the process of inspection and classification of defects in Printed Circuit Board (PCB), other researchers have proposed many methods. However, few of them published their dataset before, which hindered the…
In this paper, a methodology to detect inconsistencies in classification-based image steganalysis is presented. The proposed approach uses two classifiers: the usual one, trained with a set formed by cover and stego images, and a second…