Related papers: Optical identification of crystal defects in CCD m…
Symmetry detection and discrimination are of fundamental meaning in science, technology, and engineering. This paper introduces reflection invariants and defines the directional moment to detect symmetry for shape analysis and object…
The possibility of using CCD detectors in a low threshold direct detection dark matter search experiment is discussed. We present the main features of the DECam detectors that make them a good alternative for such an experiment, namely…
We propose a method to identify the direction of an incident Weakly Interacting Massive Particle (WIMP) via induced nuclear recoil. Our method is based on spectroscopic interrogation of quantum defects in macroscopic solid-state crystals .…
We propose schemes for the detection of topological defect dark matter using pulsars and other luminous extraterrestrial systems via non-gravitational signatures. The dark matter field, which makes up a defect, may interact with standard…
The DAMIC (Dark Matter in CCDs) experiment uses high resistivity, scientific grade CCDs to search for dark matter. The CCD's low electronic noise allows an unprecedently low energy threshold of a few tens of eV that make it possible to…
A method of the mid-IR-laser microscopy has been proposed for the investigation of the large-scale electrically and recombination active defects in semiconductors and non-destructive inspection of semiconductor materials and structures in…
Even the best quality 2D materials have non-negligible concentrations of vacancies and impurities. It is critical to understand and quantify how defects change intrinsic properties, and use this knowledge to generate functionality. This…
The direct detection rate for supersymmetric cold dark matter (CDM) particles is calculated for a number of suitable nuclear targets. Both the coherent and spin contributions are considered. By considering representative phenomenologically…
Due to their technological importance, point defects in silicon are among the best studied physical systems. The experimental examination of point defects buried in bulk is difficult and evidence for the various defects usually indirect.…
Solar photovoltaic (PV) modules are prone to damage during manufacturing, installation and operation which reduces their power conversion efficiency. This diminishes their positive environmental impact over the lifecycle. Continuous…
An incomplete particle identification distorts the observed event-by-event fluctuations of the hadron chemical composition in nucleus-nucleus collisions. A new experimental technique called the {\em identity method} was recently proposed.…
A generic fast method for object classification is proposed. In addition, a method for dimensional reduction is presented. The presented algorithms have been applied to real-world data from chip fabrication successfully to the task of…
We propose an improved structure of an optical biosensor based on a photonic crystal (PC) with a defect layer (DL), which can detect the concentration of SARS-CoV-2 in water by defect mode (DM) shift. We investigated 4 types of defective…
Models in which the dark matter is very weakly coupled to the observable sector may explain the observed dark matter density, either as a "superWIMP" or as "asymmetric dark matter." Both types of models predict displaced vertices at…
A new method for identifying crystalline phases in X-ray diffraction data has been proposed, which is especially useful for the study of multiphase materials (more than eight - ten phases) with a relatively low content (less than 1 - 3…
The order parameter of the smectic liquid crystal phase is the same as that of a superfluid or superconductor, namely a complex scalar field. We show that the essential difference in boundary conditions between these systems leads to a…
Previous works for PCB defect detection based on image difference and image processing techniques have already achieved promising performance. However, they sometimes fall short because of the unaccounted defect patterns or over-sensitivity…
We present the compact group approach to analysis of the long-wavelength dielectric and optical characteristics of substances which can be modeled as macroscopically homogeneous and isotropic systems of hard dielectric particles embedded…
Crystalline materials, such as metals and semiconductors, nearly always contain a special defect type called dislocation. This defect decisively determines many important material properties, e.g., strength, fracture toughness, or…
Mechanical properties in crystals are strongly correlated to the arrangement of 1D line defects, termed dislocations. Recently, Dark field X-ray Microscopy (DFXM) has emerged as a new tool to image and interpret dislocations within crystals…