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The Scanning Tunneling Microscope is a powerful tool for studying the electronic properties at the atomic level, however it's relatively small scanning range and the fact that it can only operate on conducting samples prevents its…
Over the past decade, reflection matrix microscopy (RMM) and advanced image reconstruction algorithms have emerged to address the fundamental imaging depth limitations of optical microscopy in thick biological tissues and complex media. In…
The doping of semiconductor materials is a fundamental part of modern technology, but the classical approaches have in many cases reached their limits both in regard to achievable charge carrier density, as well as mobility. Modulation…
The operation of resistive and phase-change memory (RRAM and PCM) is controlled by highly localized self-heating effects, yet detailed studies of their temperature are rare due to challenges of nanoscale thermometry. Here we show that the…
Band bending is a central concept in solid-state physics that arises from local variations in charge distribution especially near semiconductor interfaces and surfaces. Its precision measurement is vital in a variety of contexts from the…
Scanning tunneling microscopy (STM) and micro-electromechanical systems (MEMS) have traditionally addressed vastly different length scales - one resolving atoms, the other engineering macroscopic motion. Here we unite these two fields to…
Mode-division multiplexing (MDM) is becoming an enabling technique for large-capacity data communications via encoding the information on orthogonal guiding modes. However, the on-chip routing of a multimode waveguide occupies too large…
Structured illumination microscopy (SIM) improves resolution by down-modulating high-frequency information of an object to fit within the passband of the optical system. Generally, the reconstruction process requires prior knowledge of the…
Millimeter-wave (mmWave) bands have been attracting growing attention as a possible candidate for next-generation cellular networks, since the available spectrum is orders of magnitude larger than in current cellular allocations. To…
Using a Scanning Tunneling Microscope (STM), we investigate the Local Density of States (LDOS) of artificially fabricated normal metal nano-structures in contact with a superconductor. Very low temperature local spectroscopic measurements…
The knowledge of capacitance in semiconductor micro-strip detectors is important for a correct design, simulation and understanding of the detectors. Analytical approaches can efficiently complement numerical methods providing quick results…
Magnetic Field Imaging (MFI) is the newest Fault Isolation/Failure analysis technique to non-destructively and non-invasively localize defects such as electrical shorts and opens in both the die and package levels of Flip-Chips. This is…
Using a near-field microwave technique, two-dimensional images have been made of the second and third order intermodulation distortion (IMD) of Tl2Ba2CaCu2O8 and YBa2Cu3O7 thin film microwave resonators. It was found that second and third…
While functional materials with both light transmitting and electromagnetic shielding are highly desirable, only very few of them meet the stringent electromagnetic interference (EMI) shielding criteria for optoelectronic systems. Here, a…
Thin film oxides are a source of endless fascination for the materials scientist. These materials are highly flexible, can be integrated into almost limitless combinations, and exhibit many useful functionalities for device applications.…
Harnessing electron spin is crucial in developing energy-saving and high-speed devices for the next generation. In this scheme, visualizing spin-polarized electronic states aids in designing and developing new materials and devices.…
We present a method for measuring the internal state of a superconducting qubit inside an on-chip microwave resonator. We show that one qubit state can be associated with the generation of an increasingly large cavity coherent field, while…
Scanning gate microscopy images from measurements made in the vicinity of quantum point contacts were originally interpreted in terms of current flow. Some recent work has analytically connected the local density of states to conductance…
Scanning electron microscopy (SEM) is a versatile technique used to image samples at the nanoscale. Conventional imaging by this technique relies on finding the average intensity of the signal generated on a detector by secondary electrons…
A method for assessing the quality of electronic material properties of thin-film metal oxide semiconductor field-effect transistors (MOSFETs) is presented. By investigating samples with MOCVD-grown MoS${_2}$ channels exposed to atmospheric…