Local Whole-Device Scanning of Distortion in Superconducting Microwave Resonators

S. K. Remillard; A. E. Wormmeester; R. A. Huizen

doi:10.1109/TASC.2018.2803124

Local Whole-Device Scanning of Distortion in Superconducting Microwave Resonators

Superconductivity 2018-07-04 v2

Authors: S. K. Remillard , A. E. Wormmeester , R. A. Huizen

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Abstract

Using a near-field microwave technique, two-dimensional images have been made of the second and third order intermodulation distortion (IMD) of Tl2Ba2CaCu2O8 and YBa2Cu3O7 thin film microwave resonators. It was found that second and third order IMD do not have identical spatial distributions, which indicates that physical mechanisms play different roles in their generation. This technique enables the investigation of the roles of these mechanisms. As an illustration, the sensitivity to magnetic fluxons of the two orders is described, with second order being more sensitive to fluxon density.

Keywords

superconducting microwave resonators intermodulation distortion near-field microwave technique fluxons thin film spatial distribution

Cite

@article{arxiv.1709.03025,
  title  = {Local Whole-Device Scanning of Distortion in Superconducting Microwave Resonators},
  author = {S. K. Remillard and A. E. Wormmeester and R. A. Huizen},
  journal= {arXiv preprint arXiv:1709.03025},
  year   = {2018}
}

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