The two tone intermodulation arising in MgB2 thin films deposited in-situ by planar magnetron sputtering on sapphire substrates is studied. Samples are characterised using an open-ended dielectric puck resonator operating at 8.8 GHz. The experimental results show that the third order products increase with the two-tone input power with a slope ranging between 1.5 and 2.3. The behaviour can be understood introducing a mechanism of vortex penetration in grain boundaries as the most plausible source of non linearities in these films. This assumption is confirmed by the analysis of the field dependence of the surface resistance, that show a linear behaviour at all temperatures under test.
@article{arxiv.cond-mat/0305158,
title = {Microwave intermodulation distortion of MgB2 thin films},
author = {G. Lamura and A. J. Purnell and L. F. Cohen and A. Andreone and F. Chiarella and E. Di Gennaro and R. Vaglio and L. Hao and J. Gallop},
journal= {arXiv preprint arXiv:cond-mat/0305158},
year = {2009}
}
Comments
13 pages, 3 figures; to be published in Appl. Phys. Lett