Related papers: Development of simple quantitative test for lack o…
In field electron emission (FE) studies, it is important to check and analyse the quality and validity of experimental current-voltage data, which is usually plotted in one of a small number of standard forms. These include the so-called…
In field electron emission (FE) studies, it is important to check and analyse the quality and validity of results experimentally obtained from samples, using suitably plotted current-voltage [I(V)] measurements. For the traditional plotting…
An important parameter used to characterize large-area field electron emitters (LAFEs) is the characteristic apex field enhancement factor {\gamma}_C. This parameter is normally extracted from the slope of a Fowler-Nordheim (FN) plot.…
In papers on cold field electron emission from large area field emitters (LAFEs), it has become widespread practice to publish a misleading Fowler-Nordheim-type (FN-type) equation. This equation over-predicts the LAFE-average current…
The classic theory of electron field emission from a cold metal surface due to Fowler and Nordheim (FN) is re-examined and found to violate the validity criteria for the WKB approximation, for electric fields greater than about 1V per…
Field electron emission (FE) has relevance in many different technological contexts. However, many related technological papers use a physically defective elementary FE equation for local emission current density (LECD). This equation takes…
This work presents a theoretical explanation for a crossover in the linear behavior in Fowler-Nordheim (FN) plots based on cold field electron emission (CFE) experimental data. It is characterized by a clear change in the decay rate of…
This paper presents an elementary, approximate analytical treatment of cold field electron emission (CFE) from a classical nanowall. A simple model is used to bring out some of the basic physics of a class of field emitter where quantum…
This article proposes that we should think differently about predicting and interpreting measured field electron emission (FE) current-voltage [I(V)] characteristics. It is commonly assumed that I(V) data interpretation is a problem in…
In field electron emission (FE) studies, to interpret current-voltage data and extract characterization parameters, we use smooth planar metal-like emitter (SPME) methodology and a data-analysis plot. Three types exist: Millikan-Lauritsen…
Field emission (FE) electron sources are made close to atomic-scale to reach the highest spatial resolution as well as stable emission for electron microscopy, electron beam inspection and lithography. At present, no single agreed method…
Representing field emission data on a Fowler--Nordheim plot is both very common and strongly not recommended. It leads to a spurious estimation of the emitter parameters despite a very good data fit. There is a lack of a reliable method of…
The commonest method of characterizing a cold field electron emitter is to measure its current-voltage characteristics, and the commonest method of analysing these characteristics is by means of a Fowler-Nordheim (FN) plot. This…
This paper presents a new methodology for making comparisons between the theory of field electron emission (FE) and experiment, and is intended as a "demonstration of concept". This methodology is based on the value of the exponent kappa…
The theories of field electron emission from perfectly planar and smooth canonical surfaces are well understood, but they are not suitable for describing emission from rough, irregular surfaces arising in modern nanoscale electron sources.…
This article introduces an improved approach to Fowler-Nordheim (FN) plot analysis, based on a new type of intercept correction factor. This factor is more cleanly defined than the factor previously used. General enabling theory is given…
Both single emitters and large area field emitters (LAFE) are generally characterized using the slope and intercept of a Murphy-Good (or Fowler-Nordheim) plot which are used to extract the field enhancement factor and the emission area.…
We report the observation and characterization of field emission current from individual single- and few-layer graphene flakes laid on a flat SiO2/Si substrate. Measurements were performed in a scanning electron microscope chamber equipped…
For field electron emission (FE), an empirical equation for measured current I_m as a function of measured voltage V_m has the form I_m = C*(V_m)^k*exp[-B/(V_m)], where B is a constant and C and k are constants or vary weakly with V_m.…
For field emission (FE), it is widely expected that its emitting current density $J$ will become space-charge-limited current (SCLC) due the built-up of charge in-transit within a gap spacing $D$ biased at sufficiently large voltage $V$. In…