We report the observation and characterization of field emission current from individual single- and few-layer graphene flakes laid on a flat SiO2/Si substrate. Measurements were performed in a scanning electron microscope chamber equipped with nanoprobes, used as electrodes to realize local measurements of the field emission current. We achieved field emission currents up to 1 {\mu}A from the flat part of graphene flakes at applied fields of few hundred V/{\mu}m. We found that emission process is stable over a period of several hours and that it is well described by a Fowler-Nordheim model for currents over 5 orders of magnitude.
Cite
@article{arxiv.1102.3273,
title = {Field emission from single and few-layer graphene flakes},
author = {S. Santandrea and F. Giubileo and V. Grossi and S. Santucci and M. Passacantando and T. Schroeder and G. Lupina and A. Di Bartolomeo},
journal= {arXiv preprint arXiv:1102.3273},
year = {2012}
}