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Microelectromechanical systems (MEMS) have been applied to many measurement problems in physics, chemistry, biology and medicine. In parallel, cavity optomechanical systems have achieved quantum-limited displacement sensitivity and ground…

Optics · Physics 2012-07-23 Houxun Miao , Kartik Srinivasan , Vladimir Aksyuk

Three-dimensional atomic force microscopy (3D-AFM) has been a powerful tool to probe the atomic-scale structure of solid-liquid interfaces. As a nanoprobe moves along the 3D volume of interfacial liquid, the probe-sample interaction force…

Accurate measurements of the nanoscale electromechanical coupling in materials, including piezo and ferroelectrics, twisted 2D layers, and biological systems is of both fundamental scientific and applied importance. Piezoresponse Force…

Mesoscale and Nanoscale Physics · Physics 2023-10-10 Roger Proksch , Ryan Wagner , Joel Lefever

The implementation of a scanning microscope capable of working in confocal, atomic force and apertureless near field configurations is presented. The microscope is designed to operate in the temperature range 4 - 300 K, using conventional…

Other Condensed Matter · Physics 2009-11-10 P. S. Fodor , H. Zhu , N. G. Patil , J. Levy

We have studied theoretically magnetic resonance force microscopy (MRFM) with a high frequency nanomechanical cantilever when the cantilever frequency matches the resonant frequency of a single electron spin. Our estimations show that in…

Mesoscale and Nanoscale Physics · Physics 2022-02-16 Gennady P. Berman , Vladimir I. Tsifrinovich

It is suggested that nano-mechanical cantilevers can be employed as high-Q filters to circumvent laser noise limitations on the sensitivity of frequency modulation spectroscopy. In this approach a cantilever is actuated by the radiation…

Quantum Physics · Physics 2009-11-10 Boris M. Chernobrod , Gennady P. Berman , Peter W. Milonni

Knowledge of surface forces is the key to understanding a large number of processes in fields ranging from physics to material science and biology. The most common method to study surfaces is dynamic atomic force microscopy (AFM). Dynamic…

Mesoscale and Nanoscale Physics · Physics 2013-02-06 Daniel Platz , Daniel Forchheimer , Erik A. Tholen , David B. Haviland

We present a method of broadening the dynamic range of optical interferometric detection of cantilever displacement. The key idea of this system is to use a wavelength-tunable laser source. The wavelength is subject to proportional-integral…

Instrumentation and Detectors · Physics 2016-11-02 Hideyuki Takahashi , Tsubasa Okamoto , Eiji Ohmichi , Hitoshi Ohta

The monitoring of accelerations is essential for a variety of applications ranging from inertial navigation to consumer electronics. The basic operation principle of an accelerometer is to measure the displacement of a flexibly mounted test…

A new technique for the fabrication of highly sensitive qPlus sensor for atomic force microscopy (AFM) is described. Focused ion beam was used to cut then weld onto a bare quartz tuning fork a sharp micro-tip from an electrochemically…

Mesoscale and Nanoscale Physics · Physics 2015-07-21 Hatem Labidi , Martin Kupsta , Taleana Huff , Mark Salomons , Douglas Vick , Marco Taucer , Jason Pitters , Robert A. Wolkow

We present a new approach to tuning fork-based atomic force microscopy for utilizing advanced "tip-on-chip" probes with high sensitivity and broad compatibility. Usually, such chip-like probes with a size reaching 2 mm x 2 mm drastically…

Instrumentation and Detectors · Physics 2022-05-19 H. Tunç Çiftçi , Michael Verhage , Tamar Cromwijk , Laurent Pham Van , Bert Koopmans , Kees Flipse , Oleg Kurnosikov

In order to develop a new structure microwave probe, the fabrication of AFM probe on the GaAs wafer was studied. A waveguide was introduced by evaporating Au film on the top and bottom surfaces of the GaAs AFM probe. A tip having 8…

Other Computer Science · Computer Science 2008-12-18 Y. Ju , M. Hamada , T. Kobayashi , H. Soyama

In this paper, a differential MOEMS accelerometer based on the Fabry-Perot (FP) micro-cavities is presented. The optical system of the device consists of two FP cavities and the mechanical system is composed of a proof mass that is…

Low-loss transmission and sensitive recovery of weak radio-frequency (rf) and microwave signals is an ubiquitous technological challenge, crucial in fields as diverse as radio astronomy, medical imaging, navigation and communication,…

Atomic force microscopy (AFM) is an analytical surface characterization tool which can reveal a sample's topography with high spatial resolution while simultaneously probing tip-sample interactions. Local measurement of chemical properties…

Applied Physics · Physics 2018-09-06 Omur E. Dagdeviren , Yoichi Miyahara , Aaron Mascaro , Peter Grutter

Cavity optomechanics has opened new avenues of research in both fundamental physics and precision measurement by significantly advancing the sensitivity achievable in detecting attonewton forces, nanoparticles, magnetic fields, and…

Applied Physics · Physics 2020-08-14 Feng Zhou , Yiliang Bao , Ramgopal Madugani , David A. Long , Jason J. Gorman , Thomas W. LeBrun

Particles with high anisotropy in their magnetic properties and shape are of increasing interest for mechanobiology, where transducing a remotely applied magnetic field vector to a local mechanical response is crucial. An outstanding…

Mesoscale and Nanoscale Physics · Physics 2024-12-24 Maria V. Efremova , Lotte Boer , Laurenz Edelmann , Lieke Ruijs , Jianing Li , Marc A. Verschuuren , Reinoud Lavrijsen

We demonstrate broadband tuning of an optomechanical microcavity optical resonance by exploring the large optomechanical coupling of a double-wheel microcavity and its uniquely low mechanical stiffness. Using a pump laser with only 13 mW at…

The detection of weak forces is a central problem in physics and engineering, ranging in importance from fundamental pursuits such as precision tests of gravity, gravitational-wave detection, and searches for dark matter, to applications…

Quantum Physics · Physics 2025-07-02 Dominika Ďurovčíková , Vivishek Sudhir

While the fundamental limit on the resolution achieved in an atomic force microscope (AFM) is clearly related to the tip radius, the fact that the tip can creep and/or wear during an experiment is often ignored. This is mainly due to the…

Mesoscale and Nanoscale Physics · Physics 2015-06-12 Sergio Santos , Victor Barcons , Josep Font , Neil H Thomson
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