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In recent years, self-assembled semiconductor nanowires have been successfully used as ultra-sensitive cantilevers in a number of unique scanning probe microscopy (SPM) settings. We describe the fabrication of ultra-low dissipation…

Applied Physics · Physics 2020-02-19 Pardis Sahafi , William Rose , Andrew Jordan , Ben Yager , Michèle Piscitelli , Raffi Budakian

Frequency conversion between microwave and optical photons is a key enabling technology to create links between superconducting quantum processors and to realize distributed quantum networks. We propose a microwave-optical transduction…

Quartz tuning fork-based atomic force microscopy (QTF-AFM) has become a powerful tool for high-resolution imaging of both conductive and insulating samples, including semiconductor structures and metal-coated surfaces as well as soft matter…

Mesoscale and Nanoscale Physics · Physics 2026-01-26 Hankyul Koh , Joon-Hyuk Ko , Wonho Jhe

A recent advance in improving the spatial resolution of magnetic force microscopy (MFM) uses as sensor tips carbon nanotubes grown at the apex of conventional silicon cantilever pyramids and coated with a thin ferromagnetic layer. Magnetic…

Mesoscale and Nanoscale Physics · Physics 2009-11-13 John R. Kirtley , Zhifeng Deng , Lan Luan , Erhan Yenilmez , Hongjie Dai , Kathryn A. Moler

Micro- and nanomechanical resonators have emerged as promising platforms for sensing a broad range of physical properties such as mass, force, torque, magnetic field, and acceleration. The sensing performance relies critically on the…

We utilize a homodyne detection technique to achieve a new sensitivity limit for atom-based, absolute radio-frequency electric field sensing of $\mathrm{5 \mu V cm^{-1} Hz^{-1/2} }$. A Mach-Zehnder interferometer is used for the homodyne…

Quantum Physics · Physics 2016-11-01 Santosh Kumar , Haoquan Fan , Harald Kübler , Jiteng Sheng , James P. Shaffer

In multifrequency atomic force microscopy higher eigenmodes are externally excited to enhance resolution and contrast while simultaneously increasing the number of experimental observables with the use of gentle forces. Here, the…

Mesoscale and Nanoscale Physics · Physics 2014-07-14 Sergio Santos , Victor Barcons

Frequency-modulation atomic force microscopy provides an outstanding precision of the measurement of chemical bonding forces. However, as the cantilever oscillates with an amplitude A that is usually on the order of atomic dimensions or…

Materials Science · Physics 2021-08-13 Ferdinand Huber , Franz J. Giessibl

This report describes a cantilever controller for magnetic resonance force microscopy (MRFM) based on a field programmable gate array (FPGA), along with the hardware and software used to integrate the controller into an experiment. The…

Instrumentation and Detectors · Physics 2009-02-12 Jonathan P. Jacky , Joseph L. Garbini , Matthew Ettus , John A. Sidles

Oscillators based on levitated particles are promising for the development of ultrasensitive force detectors. The theoretical performance of levitated nanomechanical sensors is usually characterized by the so-called thermal noise limit…

Instrumentation and Detectors · Physics 2022-03-23 Zhenhai Fu , Shaochong Zhu , Ying Dong , Xingfan Chen , Huizhu Hu , Xiaowen Gao

Miniaturized mechanical resonators have proven to be excellent force sensors. However, they usually rely on resonant sensing schemes, and their excellent performance cannot be utilized for the detection of static forces. Here, we report on…

Instrumentation and Detectors · Physics 2018-08-15 Erik Hebestreit , Martin Frimmer , René Reimann , Lukas Novotny

Various methods of force measurement with the Atomic Force Microscope (AFM) are compared for their ability to accurately determine the tip-surface force from analysis of the nonlinear cantilever motion. It is explained how intermodulation,…

Mesoscale and Nanoscale Physics · Physics 2013-03-12 Daniel Platz , Daniel Forchheimer , Erik A. Tholén , David B. Haviland

Rydberg-atom electric field sensing has shown great potential from near-DC to THz with state-of-the-art measurement metrics realized in sensitivity, phase extraction, multi-band receptivity, etc. While Rydberg-atom sensors have shown…

Quantum Physics · Physics 2026-03-17 Aveek Chandra , Narongrit Paensin , Rainer Dumke

Dynamic atomic force microscopy (AFM) modes that operate at frequencies far away from the resonance frequency of the cantilever (off-resonance tapping (ORT) modes) can provide high-resolution imaging of a wide range of sample types,…

Instrumentation and Detectors · Physics 2023-06-29 Mustafa Kangül , Navid Asmari , Santiago H. Andany , Marcos Penedo , Georg E. Fantner

Currently, Atomic Force Microscopy (AFM) is the most preferred Scanning Probe Microscopy (SPM) method due to its numerous advantages. However, increasing the scanning speed and reducing the interaction forces between the probe's tip and the…

Atomic Physics · Physics 2016-11-17 Serkan Necipoglu , Selman Cebeci , Yunus Has , Levent Guvenc , Cagatay Basdogan

We design and experimentally demonstrate an architecture for achieving navigation-grade, fiber-packaged optomechanical accelerometers that can operate with a large dynamic range, over a wide temperature range, and without sophisticated…

We present a comprehensive method for visualisation and quantification of the magnetic stray field of magnetic force microscopy (MFM) probes, applied to the particular case of custom-made multi-layered probes with controllable high/low…

Antiferromagnets (AFMs) are widely believed to be superior than ferromagnets in spintronics because of their high stability due to the vanishingly small stray field. It is thus expected that the order parameter of AFM should always align…

Mesoscale and Nanoscale Physics · Physics 2020-04-27 H. Y. Yuan , Man-Hong Yung , X. R. Wang

We present results of Niobium based SQUID magnetometers for which the weak-links are engineered by the local oxidation of thin films using an Atomic Force Microscope (AFM). Firstly, we show that this technique allows the creation of…

We propose and evaluate a new type of optical force microscope based on a standing wave optical trap. Our microscope, calibrated in-situ and operating in a dynamic mode, is able to trap, without heating, a single metallic nanoparticle of…

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