Related papers: Zero-loss/deflection map analysis
Electron microscopy is a powerful tool for visualizing the shapes of sub-nanometer objects. However, contrast is not in proportional to density distribution, and therefore achieving a quantitative understanding of specimens is not…
We study the properties of the Fraunhofer diffraction patterns produced by Gaussian beams crossing spiral phase plates. We show, both analytically and numerically, that off-axis displacements of the input beam produce asymmetric diffraction…
Pump-probe electron energy-loss spectroscopy (EELS) with femtosecond temporal resolution will be a transformative research tool for studying non-equilibrium chemistry and electronic dynamics of matter. In this paper, we propose a new…
Electron diffraction through a thin patterned silicon membrane can be used to create complex spatial modulations in electron distributions by varying the intensity of different reflections using parameters such as crystallographic…
The highly energetic electrons in a transmission electron microscope (TEM) can alter or even completely destroy the structure of samples before sufficient information can be obtained. This is especially problematic in the case of zeolites,…
The development of four-dimensional (4D) scanning transmission electron microscopy (STEM) using fast detectors has opened-up new avenues for addressing some of long-standing challenges in electron imaging. One of these challenges is how to…
In situ scanning transmission electron microscopy (STEM) through liquids is a promising approach for exploring biological and materials processes. However, options for in situ chemical identification are limited: X-ray analysis is precluded…
Measurements of the proton's form factor ratio made with polarization transfer show a striking discrepancy relative to the ratio extracted from unpolarized elastic electron-proton scattering cross sections. One hypothesis is that the…
Electron channeling contrast imaging (ECCI) is a scanning electron microscopy (SEM) based technique that enables bulk-sample characterization of crystallographic defects (e.g. dislocations, stacking faults, low angle boundaries). Despite…
Electron-optical imaging instruments like Scanning Electron Microscope (SEM) and Transmission Electron Microscope (TEM) use specially designed solenoid electromagnets for focusing of electron beam probe. Indicators of imaging performance of…
The magnetic focusing of electrons has proven its utility in fundamental studies of electron transport. Here we report the direct imaging of magnetic focusing of electron waves, specifically in a two-dimensional electron gas (2DEG). We see…
The transmission of 2-keV electrons through a polyethylene terephthalate (PET) nanocapillary with a diameter of 800 nm and a length of 10 {\mu}m is studied. The transmitted electrons are detected using a microchannel plate (MCP) with a…
Photoemission electron microscopy was used to image the electrons photoemitted from specially tailored Ag nanoparticles deposited on a Si substrate (with its native oxide SiO$_{x}$). Photoemission was induced by illumination with a Hg…
We propose a new scanning transmission electron microscopy (STEM) technique that can realize the three-dimensional (3D) characterization of vacancies, lighter and heavier dopants with high precision. Using multislice STEM imaging and…
We report on the first detailed measurements of electron backscattering from plastic scintillator targets, extending our previous work on beryllium and silicon targets. The scintillator experiment posed several additional experimental…
Motivated by the need for less destructive imaging of nanostructures, we pursue point-source in-line holography (also known as point projection microscopy, or PPM) with very low energy electrons (-100 eV). This technique exploits the recent…
Short-pulse intense lasers have the potential to model extreme astrophysical environments in laboratories. Although there are diagnostics for energetic electrons and ions resulting from laser-plasma interactions, the diagnostics to measure…
Graphene provides a fascinating testbed for new physics and exciting opportunities for future applications based on quantum phenomena. To understand the coherent flow of electrons through a graphene device, we employ a nanoscale probe that…
The focal-loss has become a widely used alternative to cross-entropy in class-imbalanced classification problems, particularly in computer vision. Despite its empirical success, a systematic information-theoretic study of the focal-loss…
Transverse electron focusing in two-dimensional electron gases (2DEGs) with strong spin-orbit coupling is revisited. The transverse focusing is related to the transmission between two contacts at the edge of a 2DEG when a perpendicular…