English
Related papers

Related papers: Zero-loss/deflection map analysis

200 papers

Defects in crystalline materials control the properties of materials, and their characterization focuses our strategies to optimize performance. Electron microscopy has served as the backbone of our understanding of defect structure and…

Materials Science · Physics 2019-03-19 Daniel S. Gianola , T. Ben Britton , Stefan Zaefferer

The TOTEM experiment has made a precise measurement of the elastic proton-proton differential cross-section at the centre-of-mass energy sqrt(s) = 8 TeV based on a high-statistics data sample obtained with the beta* = 90 optics. Both the…

We report on the development of an ultrafast Transmission Electron Microscope based on a laser-driven cold-field emission source. We first describe the instrument before reporting on numerical simulations of the laser-driven electron…

Optics · Physics 2019-11-27 G. M. Caruso , F. Houdellier , S. Weber , M. Kociak , A. Arbouet

Electron energy-loss spectroscopy (EELS) performed in transmission electron microscopes is shown to directly render the photonic local density of states (LDOS) with unprecedented spatial resolution, currently below the nanometer. Two…

Materials Science · Physics 2012-11-13 F. J. Garcia de Abajo , M. Kociak

Band gap variations in thin film structures, across grain boundaries, and in embedded nanoparticles are of increasing interest in the materials science community. As many common experimental techniques for measuring band gaps do not have…

Materials Science · Physics 2018-10-22 Cecilie S. Granerød , Wei Zhan , Øystein Prytz

Instruments to visualize transient structural changes of inhomogeneous materials on the nanometer scale with atomic spatial and temporal resolution are demanded to advance materials science, bioscience, and fusion sciences. One such…

Accelerator Physics · Physics 2017-03-20 X. Shen , R. K. Li , U. Lundström , T. J. Lane , A. H. Reid , S. P. Weathersby , X. J. Wang

In a recent paper, Phys. Rev. Lett. 81, 1074 (1998), Golubev and Zaikin (GZ) found that ``zero-point fluctuations of electrons'' contribute to the dephasing rate extracted from the magnetoresistance. As a result, the dephasing rate remains…

Disordered Systems and Neural Networks · Physics 2009-10-31 I. L. Aleiner , B. L. Altshuler , M. E. Gershenson

The method of assessing porosity using images from scanning electron microscopy is ineffective in situations where the substrate and the coating have a significantly different average atomic number, which results in a different contrast of…

Applied Physics · Physics 2022-12-16 Andrzej M. Żak , Anna Wieczorek , Agnieszka Chowaniec , Lukasz Sadowski

Entanglement, a key resource of emerging quantum technologies, describes correlations between particles that defy classical physics. It has been studied extensively on various platforms, but has remained elusive in electron microscopy.…

[Background] The electromagnetic form factors of the proton measured by unpolarized and polarized electron scattering experiments show a significant disagreement that grows with the squared four momentum transfer ($Q^{2}$). Calculations…

Nuclear Experiment · Physics 2017-06-20 D. Rimal , D. Adikaram , B. A. Raue , L. B. Weinstein , J. Arrington , W. K. Brooks , M. Ungaro , K. P. Adhikari , Z. Akbar , S. Anefalos Pereira , R. A. Badui , J. Ball , N. A. Baltzell , M. Battaglieri , V. Batourine , I. Bedlinskiy , R. P. Bennett , A. S. Biselli , S. Boiarinov , W. J. Briscoe , S. Bültmann , D. S. Carman , A. Celentano , T. Chetry , G. Ciullo , L. Clark , L. Colaneri , P. L. Cole , N. Compton , M. Contalbrigo , O. Cortes , V. Crede , A. D'Angelo , N. Dashyan , R. De Vita , A. Deur , C. Djalali , R. Dupre , H. Egiyan , A. El Alaoui , L. El Fassi , P. Eugenio , G. Fedotov , R. Fersch , A. Filippi , J. A. Fleming , T. A. Forest , A. Fradi , N. Gevorgyan , Y. Ghandilyan , G. P. Gilfoyle , K. L. Giovanetti , F. X. Girod , C. Gleason , W. Gohn , E. Golovatch , R. W. Gothe , K. A. Griffioen , L. Guo , K. Hafidi , C. Hanretty , N. Harrison , M. Hattawy , D. Heddle , K. Hicks , M. Holtrop , S. M. Hughes , Y. Ilieva , D. G. Ireland , B. S. Ishkhanov , E. L. Isupov , D. Jenkins , H. Jiang , S. Joosten , D. Keller , P. Khetarpal , G. Khachatryan , M. Khandaker , W. Kim , A. Klein , F. J. Klein , V. Kubarovsky , S. E. Kuhn , S. V. Kuleshov , L. Lanza , P. Lenisa , K. Livingston , H. Y. Lu , I . J . D. MacGregor , N. Markov , B. McKinnon , M. D. Mestayer , M. Mirazita , V. Mokeev , A Movsisyan , E. Munevar , C. Munoz Camacho , P. Nadel-Turonski , A. Ni , S. Niccolai , G. Niculescu , I. Niculescu , M. Osipenko , A. I. Ostrovidov , M. Paolone , R. Paremuzyan , K. Park , E. Pasyuk , W. Phelps , S. Pisano , O. Pogorelko , J. W. Price , Y. Prok , D. Protopopescu , A. J. R. Puckett , A. Rizzo , G. Rosner , P. Rossi , P. Roy , F. Sabatié , C. Salgado , R. A. Schumacher , E. Seder , Y. G. Sharabian , Iu. Skorodumina , G. D. Smith , D. Sokhan , N. Sparveris , Ivana Stankovic , S. Stepanyan , S. Strauch , V. Sytnik , M. Taiuti , B. Torayev , H. Voskanyan , E. Voutier , N. K. Walford , D. P. Watts , X. Wei , M. H. Wood , N. Zachariou , L. Zana , J. Zhang , Z. W. Zhao , I. Zonta

Aberration-corrected scanning transmission electron microscopes (STEM) provide sub-angstrom lateral resolution; however, the large convergence angle greatly reduces the depth of field. For microscopes with a small depth of field,…

Materials Science · Physics 2011-12-15 Robert Hovden , Huolin L. Xin , David A. Muller

We study the electron-energy loss spectra of strongly correlated electronic systems doped away from half-filling using dynamical mean-field theory ($d=\infty$). The formalism can be used to study the loss spectra in the optical (${\bf…

Strongly Correlated Electrons · Physics 2009-10-31 Luis Craco , Mukul S. Laad

Quantitative interpretation of transmission electron microscopy (TEM) data of crystalline specimens often requires the accurate knowledge of the local crystal orientation. A method is presented which exploits momentum-resolved scanning TEM…

The quantum coherence of electrons can be probed by studying weak localization corrections to the conductivity. Interaction effects lead to dephasing, with electron-electron interactions being the important intrinsic mechanism. A…

Condensed Matter · Physics 2007-05-23 D. S. Golubev , A. D. Zaikin , Gerd Schön

Significant progress has been made in spatial resolution using environmental transmission electron microscopes (ETEM), which now enables atomic resolution visualization of structural transformation under variable temperature and gas…

Materials Science · Physics 2015-06-18 Wenpei Gao , Jianbo Wu , Xiaofeng Zhang , Aram Yoon , J. Mabon , W. Swiech , W. L. Wilson , H. Yang , Jian-Min Zuo

Advances in atomic resolution in situ environmental transmission electron microscopy for direct probing of gas-solid reactions, including at very high temperatures are described. In addition, recent developments of dynamic real time in situ…

Chemical Physics · Physics 2017-05-17 Pratibha Gai , Edward Boyes

The elastic and inelastic high--energy small--angle electron--positron scattering is considered. All radiative corrections to the cross--section with the relative accuracy $\delta\sigma/ \sigma = 0.1 \% $ are explicitly taken into account.…

High Energy Physics - Phenomenology · Physics 2009-10-28 A. B. Arbuzov , V. S. Fadin , E. A. Kuraev , L. N. Lipatov , N. P. Merenkov , L. G. Trentadue

Correlative light and electron microscopy is a powerful tool to study the internal structure of cells. It combines the mutual benefit of correlating light (LM) and electron (EM) microscopy information. However, the classical approach of…

Computer Vision and Pattern Recognition · Computer Science 2022-08-22 Fengjiao Ma , Rainer Kaufmann , Jaroslaw Sedzicki , Zoltán Cseresnyés , Christoph Dehio , Stephanie Hoeppener , Marc Thilo Figge , Rainer Heintzmann

A transmission electron microscope that takes advantage of superconducting quantum circuitry is proposed. The microscope is designed to improve image contrast of radiation-sensitive weak phase objects, in particular biological specimens.…

Quantum Physics · Physics 2015-05-27 Hiroshi Okamoto

Electron microscopy prevalently uses energy-dispersive x-ray spectroscopy (EDS) and electron energy loss spectroscopy (EELS) for elemental analysis. EDS and EELS energy resolutions are commonly between 30-100 eV or 0.01-1 eV, respectively.…