Related papers: Reference-Plane Invariant Method for Measuring Ele…
We present a robust, precise, and accurate method to simultaneously measure the refractive indices of two transparent materials within an interference coating. This is achieved by measuring both a photometrically accurate transmittance…
We develop an approach to use nanostructured plasmonic materials as a non-magnetic negative-refractive index system at optical and near-infrared frequencies. In contrast to conventional negative refraction materials, our design does not…
Frequency domain spectroscopy allows an experimenter to establish optical properties of solids in a wide frequency band including the technically challenging 10 THz region, and in other bands enables metrological comparison between…
Using polarization measurements in remote sensing and optical studies allows retrieving more information. We consider relationship between the reflection coefficients of plane and rough surfaces for linearly polarized waves. Certain…
We suggest an inverse dispersion method for calculating photonic band diagram for materials with arbitrary frequency-dependent dielectric functions. The method is able to calculate the complex wave vector for a given frequency by solving…
We present a novel approach to determine the constitutive properties of metals under large plastic strains and strain rates that otherwise are difficult to access using conventional materials testing methods. The approach exploits…
Ferromagnetic resonance has been used to study the magnetic properties and magnetization dynamics of polycrystalline Fe$_{1-x}$V$_{x}$ alloy films with $0\leq x < 0.7$. Films were produced by co-sputtering from separate Fe and V targets,…
Electron diffraction through a thin patterned silicon membrane can be used to create complex spatial modulations in electron distributions by varying the intensity of different reflections using parameters such as crystallographic…
The paper considers an opportunity for the creation of an artificial two-component metamaterial with a negative refractive index within the radio and optical frequency band, which possesses a spatial dispersion. It is shown that there…
Spectroscopic ellipsometry is a powerful method with high surface sensitivity that can be used to monitor the growth of even sub-monolayer film. However, the analysis of ultrathin films is complicated by the correlation of the dielectric…
A general algorithm for calculating the reflection and refraction of nonuniform plane waves from an arbitrarily oriented and charged planar interface between two lossy isotropic media is proposed based on the decomposition of the complex…
We present an innovative contactless method suitable to study in-plane thermal transport based on beam-offset frequency-domain thermoreflectance using a one-dimensional heat source with uniform power distribution. Using a one-dimensional…
After the prediction that strong enough optical activity may result in negative refraction and negative reflection, more and more artificial chiral metamaterials were designed and fabricated at difference frequency ranges from microwaves to…
We have developed a new technique for photothermal displacement spectroscopy that is potentially orders of magnitude more sensitive than conventional methods. We use a single Fabry-Perot resonator to enhance both the intensity of the pump…
A new method for identifying crystalline phases in X-ray diffraction data has been proposed, which is especially useful for the study of multiphase materials (more than eight - ten phases) with a relatively low content (less than 1 - 3…
The nonlinear response of materials, an increasingly important aspect of light-matter interaction, can be challenging to measure in highly absorbing materials. Here, we introduce an interferometric technique that enables a direct…
We present an analytical model which permits the calculation of effective material parameters for planar metamaterials consisting of arbitrary unit cells (metaatoms) formed by a set of straight wire sections of potentially different shape.…
The refraction properties of phononic crystals are revealed by examining the anti-plane shear waves in doubly periodic elastic composites with unit cells containing rectangular and/or elliptical inclusions. The band-structure, group…
Neutron and X-ray reflectometry are powerful techniques facilitating the study of the structure of interfacial materials. The analysis of these techniques is ill-posed in nature requiring the application of a model-dependent methods. This…
We investigate an inductive probe head suitable for non-invasive characterization of the magnetostatic and dynamic parameters of magnetic thin films and multilayers on the wafer scale. The probe is based on a planar waveguide with rearward…