Related papers: Reference-Plane Invariant Method for Measuring Ele…
This article aims at developing a simple, automated test bench procedure to measure polarization rotation of an electromagnetic wave upon propagation through a nonreciprocal medium. A comprehensive measurement approach is developed from the…
The scattering parameter extraction method of metamaterial homogenization is reviewed to show that the only ambiguity is the one related to the choice of the branch of the complex logarithmic function (or the complex inverse cosine…
We analyse the dispersion properties of two types of explicit finite element methods for modelling acoustic and elastic wave propagation on tetrahedral meshes, namely mass-lumped finite element methods and symmetric interior penalty…
Extremely anisotropic metal-dielectric multilayer metamaterials are designed to have the effective permittivity tensor of a transverse component (parallel to the interfaces of the multilayer) with zero real part and a longitudinal component…
We introduce a nanomechanical platform for fast and sensitive measurements of the spectrally-resolved optical dielectric function of 2D materials. At the heart of our approach is a suspended 2D material integrated into a nanomechanical…
In recent years, interesting materials have emerged which are only available as micron-scale flakes, and whose novel physics might be better understood through broadband microwave spectroscopy; examples include twisted bilayer graphene [1],…
We demonstrate composite media with ferromagnetic wires that exhibit a frequency region at the microwave regime with scattering spectra strongly dependent on an external magnetic field or stress. These tunable composite materials have…
The paper proposes a simple and efficient method to study the dielectric properties of composite materials modeled using very large random resistor-capacitor (RC) networks. The algorithm is based on the Frank-Lobb reduction scheme and…
To design semiconductor-based optical devices, the optical properties of the used semiconductor materials must be precisely measured over a large band. Transmission spectroscopy stands out as an inexpensive and widely available method for…
Moisture estimation of sub-surface soil and the overlaying biomass layer is pivotal in precision agriculture and wildfire risk assessment. However, the characterization of layered material is nontrivial due to the radar…
A method is presented for the determination of complex-valued compression and shear elastic moduli of polymers for ultrasound applications. The resulting values, which are scarcely reported in the literature, are found with uncertainties…
We present two uniqueness results for the inverse problem of determining an index of refraction by the corresponding acoustic far-field measurement encoded into the scattering amplitude. The first one is a local uniqueness in determining a…
Using a quantum electrodynamic framework, we calculate the off-resonant scattering of a broad-band X-ray pulse from a sample initially prepared in an arbitrary superposition of electronic states. The signal consists of single-particle…
A fundamental pursuit of microwave metrology is the determination of the characteristic impedance profile of microwave systems. Among other methods, this can be practically achieved by means of time-domain reflectometry (TDR) that measures…
The refractive index of single microparticles is derived from precise measurement and rigorous modeling of the stiffness of a laser trap. We demonstrate the method for particles of four different materials with diameters from 1.6 to 5.2…
Time-domain thermoreflectance (TDTR) and frequency-domain thermoreflectance (FDTR) have been widely used for non-contact measurement of anisotropic thermal conductivity of materials with high spatial resolution. However, the requirement of…
We study imaging with an array of sensors that probes a medium with single frequency electromagnetic waves and records the scattered electric field. The medium is known and homogenous except for some small and penetrable inclusions. The…
Planar metamaterials with tailorable electromagnetic properties in the terahertz domain offer customized optics solutions that are needed for the development of imaging and spectroscopy systems. In particular, metamaterials carry the…
Metamaterial effective parameters may exhibit freedom from typical dispersion constraints. For instance, the emergence of a magnetic response in arrays of split-ring resonators for long wavelengths cannot be attained in a passive continuous…
Speckle metrology is a powerful tool in the measurement of wavelength and spectra. Recently, speckle produced by multiple reflections inside an integrating sphere has been proposed and showed high performance. However, to our knowledge, a…