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X-ray micro tomography is a non-destructive, three-dimensional inspection technique applied across a vast range of fields and disciplines, ranging from research to industrial, encompassing engineering, biology and medical research.…

X-ray photon-counting detector (PCD) offers low noise, high resolution, and spectral characterization, representing a next generation of CT and enabling new biomedical applications. It is well known that involuntary patient motion may…

Medical Physics · Physics 2022-10-20 Mengzhou Li , Chiara Lowe , Anthony Butler , Phil Butler , Ge Wang

Convergent beam electron diffraction is routinely applied for studying deformation and local strain in thick crystals by matching the crystal structure to the observed intensity distributions. Recently, it has been demonstrated that CBED…

Mesoscale and Nanoscale Physics · Physics 2020-03-31 Tatiana Latychevskaia , Colin Robert Woods , Yi Bo Wang , Matthew Holwill , Eric Prestat , Sarah J. Haigh , Kostya S. Novoselov

The population of dislocation defects in a crystalline material strongly influences its properties, so the ability to analyse this population in experimental samples is of great utility. As a complement to direct counting in the…

Materials Science · Physics 2022-05-02 C P Race , T Ungar , G Ribarik

In conventional x-ray ptychography, diffraction data is collected by scanning a sample through a monochromatic, and spatially coherent, x-ray beam. A high-resolution image is then retrieved using an iterative algorithm. Combined with a scan…

Optics · Physics 2025-08-26 Wiebe Stolp , Silvia Cipiccia , Darren Batey , Matthieu Boone

Transient X-ray absorption techniques can measure ultrafast dynamics of the elemental edges in a material or multiple layer junction, giving them immense potential for deconvoluting concurrent processes. However, the interpretation of the…

Materials Science · Physics 2021-06-10 Hanzhe Liu , Isabel M. Klein , Jonathan M. Michelsen , Scott K. Cushing

Direct observation of organic molecular nanocrystals and their evolution using electron microscopy is extremely challenging, due to their radiation sensitivity and complex structure. Here, we introduce 4D-scanning confocal electron…

Materials Science · Physics 2022-06-15 Mingjian Wu , Christina Harreiss , Colin Ophus , Erdmann Spiecker

Energy-dispersive X-ray diffraction (EDXRD) is extremely insensitive to sample morphology when implemented in a back-reflection geometry. The capabilities of this non-invasive technique for cultural heritage applications have been explored…

Instrumentation and Detectors · Physics 2021-11-19 Craig I. Hiley , Graeme M. Hansford , Nicholas Eastaugh

X-ray interaction with matter is an energy-dependent process that is contingent on the atomic structure of the constituent material elements. The most advanced models to capture this relationship currently rely on Monte Carlo (MC)…

Machine Learning · Computer Science 2023-07-11 Raziye Kubra Kumrular , Thomas Blumensath

Three-dimensional (3D) imaging of thin, extended specimens at nanometer resolution is critical for applications in biology, materials science, advanced synthesis, and manufacturing. One route to 3D imaging is tomography, which requires a…

Instrumentation and Detectors · Physics 2023-10-23 Deepan Balakrishnan , See Wee Chee , Zhaslan Baraissov , Michel Bosman , Utkur Mirsaidov , N. Duane Loh

Ptychography enables coherent diffractive imaging (CDI) of extended samples by raster scanning across the illuminating XUV/X-ray beam thereby generalizing the unique advantages of CDI techniques. Table-top realizations of this method are…

Van der Waals heterostructures, which explore the synergetic properties of two-dimensional (2D) materials when assembled into three-dimensional stacks, have already brought to life a number of exciting new phenomena and novel electronic…

Mesoscale and Nanoscale Physics · Physics 2018-08-02 Tatiana Latychevskaia , Colin Robert Woods , Yi Bo Wang , Matthew Holwill , Eric Prestat , Sarah J. Haigh , Kostya S. Novoselov

The ability to measure small deformations or strains is useful for understanding many aspects of materials. Here, a new analysis of speckle diffraction peaks is presented in which the systematic shifts of the speckles are analyzed allowing…

Materials Science · Physics 2021-02-17 Mark Sutton , J. R. M. Lhermitte , F. Livet , F. Ehrburger-Dolle

Structure determination is a key application of XFELs and 4th generation synchrotron sources, particularly using the coherent and pulsed X-ray radiation from X-ray free-electron lasers (XFEL). Scientific interest focuses on understanding…

Instrumentation and Detectors · Physics 2025-03-07 Markus Kuster , Robert Hartmann , Steffen Hauf , Peter Holl , Tonn Rüter , Lothar Strüder

Compact laboratory-scale X-ray sources still rely on the same fundamental principles as in the first X-ray tubes developed more than a century ago. In recent years, significant research and development have focused on large-scale X-ray…

Despite the huge advancement in knowledge discovery and data mining techniques, the X-ray diffraction (XRD) analysis process has mostly remained untouched and still involves manual investigation, comparison, and verification. Due to the…

Resonant X-ray scattering (RXS) is a spectroscopy where both the power of site selective diffraction and the power of local absorption spectroscopy regarding atomic species are combined. By virtue of the dependence on the core level state…

Materials Science · Physics 2007-11-12 Yves Joly , Elena S. Nazarenko , José-Emilio Lorenzo , Sergio Di Matteo , Calogero R. Natoli

The routine atomic-resolution structure determination of single particles is expected to have profound implications for probing the structure-function relationship in systems ranging from energy materials to biological molecules.…

Analyzing large X-ray diffraction (XRD) datasets is a key step in high-throughput mapping of the compositional phase diagrams of combinatorial materials libraries. Optimizing and automating this task can help accelerate the process of…

In the previous paper of this series [D. P. Varn, G. S. Canright, and J. P. Crutchfield, Physical Review B, submitted] we detailed a procedure--epsilon-machine spectral reconstruction--to discover and analyze patterns and disorder in…

Materials Science · Physics 2007-05-23 D. P. Varn , G. S. Canright , J. P. Crutchfield
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