Related papers: Coaxial Atomic Force Microscope Tweezers
The force field of optical tweezers is commonly assumed to be conservative, neglecting the complex action of the scattering force. Using a novel method that extracts local forces from trajectories of an optically trapped particle, we…
Atomic force microscopy (AFM) is an essential nanoinstrument technique for several applications such as cell biology and nanoelectronics metrology and inspection. The need for statistically significant sample sizes means that data…
We report for the first time the theory of optical tweezers of spherical dielectric particles embedded in a chiral medium. We develop a partial-wave (Mie) expansion to calculate the optical force acting on a dielectric microsphere…
Vortex-based single-beam tweezers have the ability to precisely and selectively move a wide range of objects, including particles, bubbles, droplets, and cells with sizes ranging from the millimeter to micrometer scale. In 2017, Karlsen and…
Optical tweezers are tools made of light that enable contactless pushing, trapping, and manipulation of objects ranging from atoms to space light sails. Since the pioneering work by Arthur Ashkin in the 1970s, optical tweezers have evolved…
Optical tweezers are highly versatile laser traps for neutral microparticles, with fundamental applications in physics and in single molecule cell biology. Force measurements are performed by converting the stiffness response to…
The exceptional interest in improving the limitations of data storage, molecular electronics, and optoelectronics has promoted the development of an ever increasing number of techniques used to pattern polymers at micro and nanoscale. Most…
This study presents an advanced numerical framework that integrates experimentally acquired Atomic Force Microscope (AFM) data into high-fidelity simulations for adhesive rough contact problems, bridging the gap between experimental physics…
While offering unprecedented resolution of atomic and electronic structure, Scanning Probe Microscopy techniques have found greater challenges in providing reliable electrostatic characterization at the same scale. In this work, we…
Optical tweezers has emerged as a powerful tool in manipulating microscopic particles and in measuring weak forces of the order of a pico-Newton. As a result, it has found wide applications ranging from material science to biology.…
Optical tweezers are powerful tools based on focused laser beams. They are able to trap, manipulate and investigate a wide range of microscopic and nanoscopic particles in different media, such as liquids, air, and vacuum. Key applications…
Electrostatic force microscopy at cryogenic temperatures is used to probe the electrostatic interaction of a conductive atomic force microscopy tip and electronic charges trapped in localized states in an insulating layer on a…
Optical tweezers is a very well-established technique that has developed into a standard tool for trapping and manipulating micron and submicron particles with great success in the last decades. Although the nature of light enforces…
Micro-focused X-ray beams produced by third generation synchrotron sources offer new perspective of studying strains and processes at nanoscale. Atomic force microscope setup combined with a micro-focused synchrotron beam allows precise…
Optical tweezers have become essential tools to manipulate atoms or molecules at a single particle level. However, using standard diffracted-limited optical systems, the transverse size of the trap is lower bounded by the optical…
Using optical tweezers and a haptic device, microspheres having diameters ranging from 3 to 4 um (floating in a fluid solution) are manipulated in order to form patterns of coupled optical microresonators by assembling the spheres via…
Dynamic-mode atomic force microscopy (AFM) in liquid remains complicated due to the strong viscous damping of the cantilever resonance. Here we show that a high-quality resonance (Q>20) can be achieved in aqueous solution by attaching a…
Detection of dynamic surface displacements associated with local changes in material strain provides access to a number of phenomena and material properties. Contact resonance-enhanced methods of Atomic Force Microscopy (AFM) have been…
Analytical solution for optical trapping force on a spherical dielectric particle for an arbitrary positioned focused beam is presented in a generalized Lorenz-Mie and vectorial diffraction theory. In this case the exact electromagnetic…
We demonstrate that a set of microfabricated electrodes can be coupled to a commercial optical tweezers device, implementing a hybrid electro-optical trap with multiple functionalities to manipulate micro/nanoparticles in suspension. Our…