Related papers: Coaxial Atomic Force Microscope Tweezers
Acoustic radiation forces (ARFs) induced by a single Bessel beam with arbitrary order and location on a nonspherical shape are studied using the T-matrix method (TMM) in three dimensions. Based on the radiation stress tensor approach and…
Acoustic tweezers comprising a surface acoustic wave chip and a disposable silicon microfluidic chip are potentially advantageous to stable and cost-ffective acoustofluidic experiments while avoiding the cross-contamination by reusing the…
The contactless selective manipulation of individual objects at the microscale is powerfully enabled by acoustical tweezers based on acoustical vortices [Baudoin et al., Sci. Adv., 5:eaav1967 (2019)]. Nevertheless, the ability to assemble…
Atomic interferometers measure forces and acceleration with exceptional precision. The conventional approach to atomic interferometry is to launch an atomic cloud into a ballistic trajectory and perform the wave-packet splitting in momentum…
Since the invention of the atomic force microscope (AFM) in 1986, there has been a drive to apply this scanning probe technique or a form of this technique to various disciplines in nanoscale science. Magnetic force microscopy (MFM) is a…
The ability to probe a materials electromechanical functionality on the nanoscale is critical to applications from energy storage and computing to biology and medicine. Voltage modulated atomic force microscopy (VM-AFM) has become a…
We use the tip of an atomic force microscope (AFM) to charge floating metallic gates defined on the surface of a Si/SiGe heterostructure. The AFM tip serves as an ideal and movable cryogenic switch, allowing us to bias a floating gate to a…
Selective single beam tweezers open tremendous perspectives in microfluidics and microbiology for the micromanipulation, assembly and mechanical properties testing of microparticles, cells and microorganisms. In optics, single beam optical…
Holographic optical tweezers use computer-generated holograms to create arbitrary three-dimensional configurations of single-beam optical traps useful for capturing, moving and transforming mesoscopic objects. Through a combination of…
We demonstrate a miniature, fiber-coupled optical tweezer to trap a single atom. The same fiber is used to trap a single atom and to read out its fluorescence. To obtain a low background level, the tweezer light is chopped, and we measure…
The coherence of quantum dot qubits fabricated in semiconductors is often limited by charge noise from defects in gate dielectrics, which are material- and process-dependent. Characterizing these defects is an important step towards…
We demonstrate a dynamic scanning capacitance microscope (DSCM) that operates at large bandwidths, cryogenic temperatures and high magnetic fields. The setup is based on a non-contact atomic force microscope (AFM) with a quartz tuning fork…
The atomic force microscope (AFM) is a versatile, high-resolution tool used to characterize the topography and material properties of a large variety of specimens at nano-scale. The interaction of the micro-cantilever tip with the specimen…
This paper presents a microfluidic device that implements standing surface acoustic waves in order to handle single cells, droplets, and generally particles. The particles are moved in a very controlled manner by the two-dimensional…
Optical tweezers equipped with position detection allow for application of piconewton-scale forces and high-temporal-resolution measurements of nanometer-scale motion. While typically used for trapping microscopic objects, the optical…
Atomic Force Microscopy (AFM) has become established as a powerful and a versatile tool for investigating local mechanical properties. In addition, it has been made possible to take advantage of the AFM tip-sample interaction, to perturb,…
We investigate the capillary force that applies on a tilted cylinder as a function of its dipping angle i, using a home-built tilting Atomic Force Microscope (AFM) with custom made probes. A micrometric-size rod is glued at the end of an…
In this article, we present a deflection measurement setup for Atomic Force Microscopy (AFM). It is based on a quadrature phase differential interferometer: we measure the optical path difference between a laser beam reflecting above the…
We discuss the influence of external forces on the motion of the tip in dynamic atomic force microscopy (AFM). First, a compact solution for the steady-state problem is derived employing a Fourier approach. Founding on this solution, we…
Stretchable conductors are of crucial relevance for emerging technologies such as wearable electronics, low-invasive bioelectronic implants or soft actuators for robotics. A critical issue for their development regards the understanding of…