Related papers: Coaxial Atomic Force Microscope Tweezers
The ongoing development of single electron, nano and atomic scale semiconductor devices would benefit greatly from a characterization tool capable of detecting single electron charging events with high spatial resolution, at low…
In this activity, students will make a working model of an atomic force microscope (AFM). A permanent magnet attached to a compact disc (CD) strip acts as the sensor. The sensor is attached to a base made from Legos. Laser light is…
Atomic Force Microscopy (AFM) allows to reconstruct the topography of surface with a resolution in the nanometer range. The exceptional resolution attainable with the AFM makes this instrument a key tool in nanoscience and technology. The…
Forces acting between an Atomic Force Microscope (AFM) tip and sample are three dimensional. Despite this, most AFM force measurements are confined to one or two dimensions. Extending AFM force measurements into three dimensions has…
Sub-nm resolution images can be achieved by Atomic Force Microscopy (AFM) on samples that are deposited on hard substrates. However, it is still extremely challenging to image soft interfaces, such as biological membranes, due to the…
Trapping of single ultracold atoms is an important tool for applications ranging from quantum computation and communication to sensing. However, most experimental setups, while very precise and versatile, can only be operated in specialized…
We demonstrate a simple method to significantly improve the sharpness of standard silicon probes for an atomic force microscope, or to repair a damaged probe. The method is based on creating and maintaining a strong, spatially localized…
Atomic Force Microscopy (AFM) allows to probe matter at atomic scale by measuring the perturbation of a nanomechanical oscillator induced by near-field interaction forces. The quest to improve sensitivity and resolution of AFM has forced…
Acoustical tweezers based on focalized acoustical vortices hold the promise of precise contactless 3D manipulation of millimeter down to sub-micrometer particles, microorganisms and cells with unprecedented combined selectivity and trapping…
We demonstrate the trapping of elastic particles by the large gradient force of a single acoustical beam in three dimensions. Acoustical tweezers can push, pull and accurately control both the position and the forces exerted on a unique…
Atomic force microscopy (AFM) is a powerful tool to investigate interaction forces at the micro and nanoscale. Cantilever stiffness, dimensions and geometry of the tip can be chosen according to the requirements of the specific application,…
Optical tweezers, with their high precision, dynamic control, and non-invasiveness, are increasingly important in scientific research and applications at the micro and nano scales. However, manipulation by optical tweezers is challenged by…
Atomic Force Microscopy (AFM) methods utilizing resonant mechanical vibrations of cantilevers in contact with a sample surface have shown sensitivities as high as few picometers for detecting surface displacements. Such a high sensitivity…
Acoustic tweezers can manipulate microscopic objects and cells independently of the optical, magnetic and electrical properties of the objects or their medium. However, because ultrasonic waves are attenuated within few millimeters,…
Optical tweezers are a powerful tool for the precise positioning of a variety of small objects, including single neutral atoms. Once trapped, atoms can be cooled to the motional ground state of the tweezers. For a more advanced control of…
The concept of a single-beam acoustical tweezer device which can simultaneously trap microparticles at different points is proposed and demonstrated through computational simulations. The device employs an ultrasound beam produced by a…
Atomic force microscopy (AFM) is a mechanical profiling technique that allows to image surfaces with atomic resolution. Recent progress in reducing the noise of this technique has led to a resolution level where previously undetectable…
Acoustical tweezers based on focused acoustical vortices open some tremendous perspectives for the in vitro and in vivo remote manipulation of millimetric down to micrometric objects, with combined selectivity and applied forces out of…
We demonstrate the measurement of laterally induced optical forces using an Atomic Force Microscope (AFM). The lateral electric field distribution between a gold coated AFM probe and a nano-aperture in a gold film is mapped by measuring the…
Optical tweezers enable non-contact trapping of micro-scale objects using light. Despite their widespread use, it is currently not known how tightly it is possible to three-dimensionally trap micro-particles with a given photon budget.…