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Defocus blur is a physical consequence of the optical sensors used in most cameras. Although it can be used as a photographic style, it is commonly viewed as an image degradation modeled as the convolution of a sharp image with a…
The most established method of reconstructing neural circuits from animals involves slicing tissue very thin, then taking mosaics of electron microscope (EM) images. To trace neurons across different images and through different sections,…
Different tasks in the computational pipeline of single-particle cryo-electron microscopy (cryo-EM) require enhancing the quality of the highly noisy raw images. To this end, we develop an efficient algorithm for signal enhancement of…
A real-time image reconstruction method for scanning transmission electron microscopy (STEM) is proposed. With an algorithm requiring only the center of mass (COM) of the diffraction pattern at one probe position at a time, it is able to…
Single-particle cryo-electron microscopy (cryo-EM) has recently joined X-ray crystallography and NMR spectroscopy as a high-resolution structural method to resolve biological macromolecules. In a cryo-EM experiment, the microscope produces…
Shift-and-add is an approach employed to mitigate the phenomenon of resolution degradation in images acquired through a turbulent medium. Using this technique, a large number of consecutive short exposures is registered below the coherence…
Precise alignment of the electron beam is critical for successful application of scanning transmission electron microscopes (STEM) to understanding materials at atomic level. Despite the success of aberration correctors, aberration…
Low-light images often suffer from low contrast, noise, and color distortion, degrading visual quality and impairing downstream vision tasks. We propose a novel conditional diffusion framework for low-light image enhancement that…
Microstructure characterisation has been greatly enhanced through the use of electron backscatter diffraction (EBSD), where rich maps are generated through analysis of the crystal phase and orientation in the scanning electron microscope…
One common task in image forensics is to detect spliced images, where multiple source images are composed to one output image. Most of the currently best performing splicing detectors leverage high-frequency artifacts. However, after an…
Flow-based generative super-resolution (SR) models learn to produce a diverse set of feasible SR solutions, called the SR space. Diversity of SR solutions increases with the temperature ($\tau$) of latent variables, which introduces random…
Compressed sensing algorithms are used to decrease electron microscope scan time and electron beam exposure with minimal information loss. Following successful applications of deep learning to compressed sensing, we have developed a…
Coherent imaging systems, such as medical ultrasound and synthetic aperture radar (SAR), are subject to corruption from speckle due to sub-resolution scatterers. Since speckle is multiplicative in nature, the constituent image regions…
Image-based anomaly detection systems are of vital importance in various manufacturing applications. The resolution and acquisition rate of such systems is increasing significantly in recent years under the fast development of image sensing…
Four-dimensional scanning transmission electron microscopy (4D-STEM) is one of the most rapidly growing modes of electron microscopy imaging. The advent of fast pixelated cameras and the associated data infrastructure have greatly…
Digital image comparison and matching brings many advantages over the traditional subjective human comparison, including speed and reproducibility. Despite the existence of an abundance of image difference metrics, most of them are not…
Scanning transmission electron microscopy (STEM) provides high-resolution visualization of atomic structures as well as various functional imaging modes utilizing phase contrast. In this study we introduce a semicircular aperture in STEM…
Programmable electron-beam scanning offers new opportunities to improve dose efficiency and suppress scan-induced artifacts in scanning transmission electron microscopy. Here, we systematically benchmark the impact of non-raster…
In this study, we present a computational framework tailored for the precise detection and comprehensive analysis of nanoparticles within scanning electron microscopy (SEM) images. The primary objective of this framework revolves around the…
Electron microscopy is widely used to explore defects in crystal structures, but human detecting of defects is often time-consuming, error-prone, and unreliable, and is not scalable to large numbers of images or real-time analysis. In this…