English

Image Difference Metrics for High-Resolution Electron Microscopy

Materials Science 2023-06-07 v2

Abstract

Digital image comparison and matching brings many advantages over the traditional subjective human comparison, including speed and reproducibility. Despite the existence of an abundance of image difference metrics, most of them are not suited for high-resolution transmission electron microscopy (HRTEM) images. In this work we adopt two image difference metrics not widely used for TEM images. We compare them to subjective evaluation and to the mean squared error in regards to their behaviour regarding image noise pollution. Finally, the methods are applied to and tested by the task of determining precipitate sizes of a model material.

Keywords

Cite

@article{arxiv.2111.15282,
  title  = {Image Difference Metrics for High-Resolution Electron Microscopy},
  author = {Manuel Ederer and Stefan Löffler},
  journal= {arXiv preprint arXiv:2111.15282},
  year   = {2023}
}

Comments

15 pages, 4 figures

R2 v1 2026-06-24T07:57:28.438Z