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Four-dimensional scanning transmission electron microscopy (4D-STEM) of local atomic diffraction patterns is emerging as a powerful technique for probing intricate details of atomic structure and atomic electric fields. However, efficient…
The most ubiquitous form of computational aberration correction for microscopy is deconvolution. However, deconvolution relies on the assumption that the point spread function is the same across the entire field-of-view. This assumption is…
We propose a novel hue-correction scheme for multi-exposure image fusion (MEF). Various MEF methods have so far been studied to generate higher-quality images. However, there are few MEF methods considering hue distortion unlike other…
Image structure-texture decomposition is a long-standing and fundamental problem in both image processing and computer vision fields. In this paper, we propose a generalized semi-sparse regularization framework for image structural analysis…
Structure-from-Motion is a technology used to obtain scene structure through image collection, which is a fundamental problem in computer vision. For unordered Internet images, SfM is very slow due to the lack of prior knowledge about image…
Linear phase-contrast scanning transmission electron microscopy (STEM) techniques compatible with high-throughput 4D-STEM acquisition are widely used to enhance phase contrast in weakly scattering and beam-sensitive materials. In these…
The manuscript considers Scanning Transmission Electron Microscopy (STEM) images and derives transformations needed to correct various distortions occurring during scanning. These transformations form the basis for the correction algorithms…
In this paper, we propose a novel design of image deblurring in the form of one-shot convolution filtering that can directly convolve with naturally blurred images for restoration. The problem of optical blurring is a common disadvantage to…
In the realm of industrial quality inspection, defect detection stands as a critical component, particularly in high-precision, safety-critical sectors such as automotive components aerospace, and medical devices. Traditional methods,…
Discrete image registration can be a strategy to reconstruct signals from samples corrupted by blur and noise. We examine superresolution and discrete image registration for one-dimensional spatially-limited piecewise constant functions…
Discrete element modelling (DEM) is one of the most efficient computational approaches to the fracture processes of heterogeneous materials on mesoscopic scales. From the dynamics of single crack propagation through the statistics of crack…
Image distortion correction is a critical pre-processing step for a variety of computer vision and image processing algorithms. Standard real-time software implementations are generally not suited for direct hardware porting, so…
Here a new microscopic method is proposed to image and characterize very thin samples like few-layer materials, organic molecules, and nanostructures with nanometer or sub-nanometer resolution using electron beams of energies lower than 20…
Physical photographs now can be conveniently scanned by smartphones and stored forever as a digital version, yet the scanned photos are not restored well. One solution is to train a supervised deep neural network on many digital photos and…
Lidar point cloud distortion from moving object is an important problem in autonomous driving, and recently becomes even more demanding with the emerging of newer lidars, which feature back-and-forth scanning patterns. Accurately estimating…
Blur artifacts can seriously degrade the visual quality of images, and numerous deblurring methods have been proposed for specific scenarios. However, in most real-world images, blur is caused by different factors, e.g., motion and defocus.…
A well-known diagnostic imaging modality, termed ultrasound tomography, was quickly developed for the detection of very small tumors whose sizes are smaller than the wavelength of the incident pressure wave without ionizing radiation,…
We propose a novel hue-correction scheme for multi-exposure image fusion (MEF). Various MEF methods have so far been studied to generate higher-quality images. However, there are few MEF methods considering hue distortion unlike other…
We reconstruct a 3D model of the surface of a material undergoing fatigue testing and experiencing cracking. Specifically we reconstruct the surface depth (out of plane intrusions and extrusions) and lateral (in-plane) motion from multiple…
Aberration-corrected scanning electron microscopy (AC-STEM) can provide valuable information on the atomic structure of nanoclusters, an essential input for gaining an understanding of their physical and chemical properties. A systematic…