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We discuss the design, construction, and use of a new class of scanning camera that eliminates a critical limitation of standard CCD drift-scan observations. A standard scan, which involves no correction for the differential drift rates and…
Defects in crystalline materials control the properties of materials, and their characterization focuses our strategies to optimize performance. Electron microscopy has served as the backbone of our understanding of defect structure and…
Unwanted motion of the probe with respect to the sample is a ubiquitous problem in scanning probe microscopy, causing both linear and nonlinear artifacts in experimental images. We have designed a procedure to correct these artifacts by…
Electron channeling contrast imaging (ECCI) is a scanning electron microscopy (SEM) based technique that enables bulk-sample characterization of crystallographic defects (e.g. dislocations, stacking faults, low angle boundaries). Despite…
Most distortion correction methods focus on simple forms of distortion, such as radial or linear distortions. These works undistort images either based on measurements in the presence of a calibration grid, or use multiple views to find…
Scanning electron microscopy (SEM), a century-old technique, is today a ubiquitous method of imaging the surface of nanostructures. However, most SEM detectors simply count the number of secondary electrons from a material of interest, and…
The field of image generation has made significant progress thanks to the introduction of Diffusion Models, which learn to progressively reverse a given image corruption. Recently, a few studies introduced alternative ways of corrupting…
Sparse-view Computed Tomography (CT) image reconstruction is a promising approach to reduce radiation exposure, but it inevitably leads to image degradation. Although diffusion model-based approaches are computationally expensive and suffer…
Underwater vision suffers from severe effects due to selective attenuation and scattering when light propagates through water. Such degradation not only affects the quality of underwater images but limits the ability of vision tasks.…
Using diffusion models to solve inverse problems is a growing field of research. Current methods assume the degradation to be known and provide impressive results in terms of restoration quality and diversity. In this work, we leverage the…
The evolution of the scanning modules for scanning transmission electron microscopes (STEM) has realized the possibility to generate arbitrary scan pathways, an approach currently explored to improve acquisition speed and to reduce electron…
Charge-Coupled Device (CCD) detectors, widely used to obtain digital imaging, can be damaged by high energy radiation. Degraded images appear blurred, because of an effect known as Charge Transfer Inefficiency (CTI), which trails bright…
Image deblurring is an economic way to reduce certain degradations (blur and noise) in acquired images. Thus, it has become essential tool in high resolution imaging in many applications, e.g., astronomy, microscopy or computational…
Pretrained vision-language models such as CLIP achieve strong zero-shot generalization but remain vulnerable to distribution shifts caused by input corruptions. In this work, we investigate how corruptions affect CLIP's image embeddings and…
Scanning Transmission Electron Microscopy (STEM) is a critical tool for imaging the properties of materials and biological specimens at atomic scale, yet our understanding of relevant electron beam damage mechanisms is incomplete. Recent…
The cryo-electron microscope (cryo-EM) is increasingly popular these years. It helps to uncover the biological structures and functions of macromolecules. In this paper, we address image denoising problem in cryo-EM. Denoising the cryo-EM…
The three scanning electron microscope diffraction based techniques of electron channelling patterns (ECPs), electron channelling contrast imaging (ECCI), and electron back scatter diffraction (EBSD) are reviewed. The dynamical diffraction…
Secondary electron (SE) imaging techniques, such as scanning electron microscopy and helium ion microscopy (HIM), use electrons emitted by a sample in response to a focused beam of charged particles incident at a grid of raster scan…
Recently it has been shown that precise dose control and an increase in the overall acquisition speed of atomic resolution scanning transmission electron microscope (STEM) images can be achieved by acquiring only a small fraction of the…
The dynamics of photo-excited charge carriers, particularly their transport and interactions with defects and interfaces, play an essential role in determining the performance of a wide range of solar and optoelectronic devices. A thorough…