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We present a detailed modeling and characterization of our scalable microwave nanoprobe, which is a micro-fabricated cantilever-based scanning microwave probe with separated excitation and sensing electrodes. Using finite-element analysis,…

Other Condensed Matter · Physics 2008-09-24 K. Lai , W. Kundhikanjana , M. Kelly , Z. X. Shen

This paper presents the design and fabrication of batch-processed cantilever probes with electrical shielding for scanning microwave impedance microscopy. The diameter of the tip apex, which defines the electrical resolution, is less than…

Instrumentation and Detectors · Physics 2013-01-14 Yongliang Yang , Keji Lai , Qiaochu Tang , Worasom Kundhikanjana , Michael A Kelly , Kun Zhang , Zhi-xun Shen , Xinxin Li

We demonstrate that a near-field microwave microscope based on a transmission line resonator allows imaging in a substantially wide range of frequencies, so that the microscope properties approach those of a spatially-resolved impedance…

Materials Science · Physics 2007-05-23 Alexander Tselev , Steven M. Anlage , Zhengkun Ma , John Melngailis

Waveguide characterization of dielectric materials is a convenient and broadband approach for measuring dielectric constant. In conventional microwave measurements, material samples are usually mechanically shaped to fit the waveguide…

Applied Physics · Physics 2022-04-20 Xuchen Wang , Sergei A. Tretyakov

By scanning a fine open-ended coaxial probe above an operating microwave device, we image local electric fields generated by the device at microwave frequencies. The probe is sensitive to the electric flux normal to the face of its center…

We have developed a near-field scanned microwave probe with a sampling volume of approximately 10 micron in diameter, which is the smallest one achieved in near-field microwave microscopy. This volume is defined to confine close to 100…

Materials Science · Physics 2009-08-03 Vladimir V. Talanov , Andre Scherz , Robert L. Moreland , Andrew R. Schwartz

A small depression is created in a straight optical fiber taper to form a local probe suitable for studying closely spaced, planar microphotonic devices. The tension of the "dimpled" taper controls the probe-sample interaction length and…

Optics · Physics 2009-11-13 C. P. Michael , M. Borselli , T. J. Johnson , C. Chrystal , O. Painter

Dielectric measurements on insulating materials at cryogenic temperatures can be challenging, depending on the frequency and temperature ranges of interest. We present a technique to study the dielectric properties of bulk dielectrics at…

Microwave spectroscopy is a powerful experimental tool to reveal information on the intrinsic properties of superconductors. Superconducting stripline resonators, where the material under study constitutes one of the ground planes, offer a…

We have realized a microstrip based THz near field cantilever which enables quantitative measurements of the impedance of the probe tip at THz frequencies (0.3 THz). A key feature is the on-chip balanced hybrid coupler which serves as an…

Scanning probe microscopy (SPM) is traditionally based on very sharp tips, where the small size of the apex is critical for resolution. This paradigm is about to shift, since a novel generation of planar probes (color centers in diamond,…

Instrumentation and Detectors · Physics 2021-06-24 Stefan Ernst , Dominik M. Irber , Andreas M. Waeber , Georg Braunbeck , Friedemann Reinhard

We describe the near-field microwave microscopy of microwave devices on a length scale much smaller than the wavelength used for imaging. Our microscope can be operated in two possible configurations, allowing a quantitative study of either…

We describe the use of a near-field scanning microwave microscope to image the permittivity and tunability of bulk and thin film dielectric samples on a length scale of about 1 micron. The microscope is sensitive to the linear permittivity,…

We have constructed several impedance-matched low-pass filters using a stripline geometry with a dissipative dielectric. The filters are compact, simple to construct, and operate in cryogenic environments. The dissipative dielectric…

Instrumentation and Detectors · Physics 2008-11-26 D. F. Santavicca , D. E. Prober

Planar scanning probe microscopy is a recently emerging alternative approach to tip-based scanning probe imaging. It can scan an extended planar sensor, such as a polished bulk diamond doped with magnetic-field-sensitive nitrogen-vacancy…

We outline calibrated measurements of the microwave reflection coefficient from the tunnel junction of an ultra-high vacuum low temperature scanning tunneling microscope. The microwave circuit design is described in detail, including an…

Instrumentation and Detectors · Physics 2023-09-14 Bareld Wit , Georg Gramse , Stefan Müllegger

The elements of the metamaterial made in the form of wave-guiding coplanar strip line type strip structures, the current-carrying strip of which is located on the upper surface of the substrate, have been experimentally investigated. On the…

We present the design and experimental results of a near-field scanning microwave microscope (NSMM) working at a frequency of 1GHz. Our microscope is unique in that the sensing probe is separated from the excitation electrode to…

Materials Science · Physics 2009-11-13 K. Lai , M. B. Ji , N. Leindecker , M. A. Kelly , Z. X. Shen

In analogy with optical near-field scanning methods, we use tapered dielectric waveguides as probes for a millimeter wave vector network analyzer. By scanning thin samples between two such probes we are able to map the spatially varying…

Soft Condensed Matter · Physics 2009-11-13 Nathan S. Greeney , John A. Scales

Aligning a microcantilever to an area of interest on a sample is a critical step in many scanning probe microscopy experiments, particularly those carried out on devices and rare, precious samples. We report a series of protocols that…

Mesoscale and Nanoscale Physics · Physics 2018-01-10 Corinne E. Isaac , Elizabeth A. Curley , Pamela T. Nasr , Hoang L. Nguyen , John A. Marohn
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