An optical fiber-taper probe for wafer-scale microphotonic device characterization
Optics
2009-11-13 v1
Abstract
A small depression is created in a straight optical fiber taper to form a local probe suitable for studying closely spaced, planar microphotonic devices. The tension of the "dimpled" taper controls the probe-sample interaction length and the level of noise present during coupling measurements. Practical demonstrations with high-Q silicon microcavities include testing a dense array of undercut microdisks (maximum Q = 3.3x10^6) and a planar microring (Q = 4.8x10^6).
Cite
@article{arxiv.physics/0702079,
title = {An optical fiber-taper probe for wafer-scale microphotonic device characterization},
author = {C. P. Michael and M. Borselli and T. J. Johnson and C. Chrystal and O. Painter},
journal= {arXiv preprint arXiv:physics/0702079},
year = {2009}
}
Comments
8 pages, 5 figures, for high-res version see http://copilot.caltech.edu/publications/index.htm