Related papers: Micro-crystalline inclusions analysis by PIXE and …
Single-particle imaging with X-ray free-electron lasers depends crucially on algorithms that merge large numbers of weak diffraction patterns despite missing measurements of parameters such as particle orientations. The…
An X-ray detector will be presented that is the combination of a segmented ionization chamber featuring one-dimensional spatial resolution integrated with an intelligent ADC front-end, multi DSP processing and embedded PC platform. This…
X-ray diffraction with high spatial resolution is commonly used to characterize (poly-)crystalline samples with, for example, respect to local strain, residual stress, grain boundaries and texture. However, the investigation of highly…
THz extinction spectroscopy extends UV-Vis and NIR-spectroscopy to characterize particles from fine powders and dust to sand, grains and granulated materials. We extract particle sizes from the spectral position of the first peak of the…
Spin squeezing has been explored in atomic systems as a tool for quantum sensing, improving experimental sensitivity beyond the spin standard quantum limit for certain measurements. To optimize absolute metrological sensitivity, it is…
An interferometric imaging technique has been proposed to instantly measure the diameter of individual spherical dust particles suspended in a gas discharge plasma. The technique is based on the defocused image analysis of both spherical…
Macroporous silicon is widely employed in sensing and optoelectronic applications due to its large internal surface area and adjustable pore structure. However, quantitative correlations between morphology and functionality require…
Quantitative phase microscopy (QPM), a technique combining phase imaging and microscopy, enables visualization of the 3D topography in reflective samples, as well as the inner structure or refractive index distribution of transparent and…
The microwave imaging system(MIS) stands out among prominent imaging tools for capturing images of concealed obstacles. Leveraging its capability to penetrate through heterogeneous environments MIS has been widely used for subsurface…
We propose an efficient algorithm to analyze $3D$ atomic resolution crystal images based on a fast $3D$ synchrosqueezed wave packet transform. The proposed algorithm can automatically extract microscopic information from $3D$ atomic…
A method for estimating the relative content of crystalline phases of a multiphase sample, based on probabilistic analysis of the intensities of the diffraction pattern reflexes, has been developed. The method is based on the introduction…
The present investigation reports on the fabrication and characterization of heterojunctions based on in situ Eu doped CdO layers, which were deposited on p-type silicon using the plasma assisted molecular beam epitaxy (PA MBE) method. The…
Energy dispersive X-ray (EDX) spectrum imaging yields compositional information with a spatial resolution down to the atomic level. However, experimental limitations often produce extremely sparse and noisy EDX spectra. Under such…
Energy-dispersive X-ray diffraction (EDXRD) is extremely insensitive to sample morphology when implemented in a back-reflection geometry. The capabilities of this non-invasive technique for cultural heritage applications have been explored…
By adjusting the incidence angle of incoming X-ray near the critical angle of X-ray total reflection, the photoelectron intensity is strongly modulated due to the variation of X-ray penetration depth. Photoelectron spectroscopy (PES)…
Atomic-resolution imaging with scanning transmission electron microscopy is a powerful tool for characterizing the nanoscale structure of materials, in particular features such as defects, local strains, and symmetry-breaking distortions.…
Recent advances in the technology of transmission electron microscopy have allowed for a more precise visualization of materials and physical processes, such as metal oxidation. Nevertheless, the quality of information is limited by the…
Size and shape are critical discriminators between molecular species and states. We describe a micro-chip based high-throughput imaging approach offering rapid and precise determination of molecular properties under native solution…
In this article a topological sensitivity framework for far field detection of a diametrically small electromagnetic inclusion is established. The cases of single and multiple measurements of the electric far field scattering amplitude at a…
Future hard (10 -100 keV) X-ray telescopes (SIMBOL-X, Con-X, HEXIT-SAT, XEUS) will implement focusing optics with multilayer coatings: in view of the production of these optics we are exploring several deposition techniques for the…