Related papers: A Nanostructual Microwave Probe Used for Atomic Fo…
In this study, four different techniques are presented. 1 Rectangular waveguide measurement technique for normal microwave materials microwave properties such as permeability and permittivity. This technique removed guess parameter and…
The fabrication and performances of cantilevered probes with reduced parasitic capacitance starting from a commercial Si3N4 cantilever chip is presented. Nanomachining and metal deposition induced by focused ion beam techniques were…
The AlGaAs material platform has been intensively used to develop nonlinear photonic devices on-a-chip, thanks to its superior nonlinear optical properties. We propose a new AlGaAs waveguide geometry, called half-core etched, which…
We report on the conversion of the Manitoba II mass spectrometer into a versatile low-energy proton beam facility. This infrastructure is adaptable to any detector-under-test (DUT), and has proven itself effective with the characterization…
A local magnetization measurement was performed with a Magnetic Force Microscope (MFM) to determine magnetization in domains of an exchange coupled [Co/Pt]/Co/Ru multilayer with predominant perpendicular anisotropy. The quantitative MFM…
When measuring quadratic values representative of random fluctuations, such as the thermal noise of Atomic Force Microscopy (AFM) cantilevers, the background measurement noise cannot be averaged to zero. We present a signal processing…
The functional properties of many technological surfaces in biotechnology, electronics, and mechanical engineering depend to a large degree on the individual features of their nanoscale surface texture, which in turn are a function of the…
This paper presents an electrolytically gated broadband microwave sensor where atomically-thin graphene layers are integrated into coplanar waveguides and coupled with microfluidic channels. The interaction between a solution under test and…
We propose and evaluate a new type of optical force microscope based on a standing wave optical trap. Our microscope, calibrated in-situ and operating in a dynamic mode, is able to trap, without heating, a single metallic nanoparticle of…
We use the all-diamond tip of an atomic force microscope for the direct engraving of high quality quantum point contacts in GaAs/AlGaAs-heterostructures. The processing time is shortened by two orders of magnitude compared to standard…
We demonstrate the fabrication of an optical nanofiber tip (ONFT) using a two-step chemical etching technique. This technique employs 30% and 24% hydrofluoric (HF) acid for the first and second steps, respectively. In the first step, a…
We use a small atomic Bose-Einstein condensate as an interferometric scanning probe to map out a microwave field near a chip surface with a few micrometers resolution. Using entanglement between the atoms we overcome the standard quantum…
We have found that the thin film aluminum structures shaped into a chain of micron sized islands connected by narrow isthmuses, can modify their electrical and structural properties under microwave radiation. As a result, at the temperature…
Reduction of the inter-probe distance in multi-probe and double-tip STM down to the nanometer scale has been a longstanding and technically difficult challenge. Recent multi-probe systems have allowed for significant progress by achieving…
We experimentally realize a Fabry-Perot-type optical microresonator near the cesium D2 line wavelength based on a tapered optical fiber, equipped with two fiber Bragg gratings which enclose a sub-wavelength diameter waist. Owing to the very…
A small depression is created in a straight optical fiber taper to form a local probe suitable for studying closely spaced, planar microphotonic devices. The tension of the "dimpled" taper controls the probe-sample interaction length and…
Full size single-sided GaAs microstrip detectors with integrated coupling capacitors and bias resistors have been fabricated on 3'' substrate wafers. PECVD deposited SiO_2 and SiO_2/Si_3N_4 layers were used to provide coupling capacitaces…
Optical detection of structures with dimensions smaller than an optical wavelength requires devices that work on scales beyond the diffraction limit. Here we present the possibility of using a tapered optical nanofiber as a detector to…
We describe the near-field microwave microscopy of microwave devices on a length scale much smaller than the wavelength used for imaging. Our microscope can be operated in two possible configurations, allowing a quantitative study of either…
We propose to use the damping signal of an oscillating cantilever in dynamic atomic force microscopy as a noninvasive tool to study the vibrational structure of the substrate. We present atomically resolved maps of damping in carbon…