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Related papers: Microdeflectometry - a novel tool to acquire 3D mi…

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We introduce a system and methods for the three-dimensional measurement of extended specular surfaces with high surface normal variations. Our system consists only of a mobile hand held device and exploits screen and front camera for…

Computer Vision and Pattern Recognition · Computer Science 2019-07-26 Florian Willomitzer , Chia-Kai Yeh , Vikas Gupta , William Spies , Florian Schiffers , Marc Walton , Oliver Cossairt

Accurate and fast 3D imaging of specular surfaces still poses major challenges for state-of-the-art optical measurement principles. Frequently used methods, such as phase-measuring deflectometry (PMD) or shape-from-polarization (SfP), rely…

Computer Vision and Pattern Recognition · Computer Science 2024-06-05 Jiazhang Wang , Oliver Cossairt , Florian Willomitzer

Deflectometry as a technical approach to assessing reflective surfaces has now existed for almost 40 years. Different aspects and variations of the method have been studied in multiple theses and research articles, and reviews are also…

Surface topography refers to the geometric micro-structure of a surface and defines its tactile characteristics (typically in the sub-millimeter range). High-resolution 3D scanning techniques developed recently enable the 3D reconstruction…

Computer Vision and Pattern Recognition · Computer Science 2015-05-07 Matthias Zeppelzauer , Markus Seidl

Schlieren deflectometry aims at characterizing the deflections undergone by refracted incident light rays at any surface point of a transparent object. For smooth surfaces, each surface location is actually associated with a sparse…

Computer Vision and Pattern Recognition · Computer Science 2012-12-04 Prasad Sudhakar , Laurent Jacques , Xavier Dubois , Philippe Antoine , Luc Joannes

We present an optical metrology system for characterization of topography of micro/nano-structures on a surface or embedded in a semi-transparent material. Based on the principles of scatterometry, where the intensity of scattered light is…

Instrumentation and Detectors · Physics 2016-01-15 Morten Hannibal Madsen , Poul-Erik Hansen

In this paper we present a new methodology for edge detection in digital images. The first originality of the proposed method is to consider image content as a parametric surface. Then, an original parametric local model of this surface…

Image and Video Processing · Electrical Eng. & Systems 2019-04-24 Rémi Cogranne , Rémi Slysz , Laurence Moreau , Houman Borouchaki

We describe a method that uses total internal reflection at the water-air interface inside a large, transparent tank, to measure the interface's deflections. Using this configuration, we obtain an optical set-up where the liquid surface…

Fluid Dynamics · Physics 2021-10-26 Utkarsh Jain , Anaïs Gauthier , Devaraj van der Meer

Super-resolution imaging using sub-diffraction field localization by micron sized transparent beads (microspheres) was recently demonstrated [1]. Practical applications in microscopy require control over the positioning of the microspheres.…

Optics · Physics 2013-12-25 Leonid A. Krivitsky , Jia Jun Wang , Zengbo Wang , Boris Lukiyanchuk

Defocused speckle photography has long been used to measure rotations of rough surfaces. This paper explains how, by adding a suitably perforated mask, some measurement properties, such as range or lateral resolution, may be changed at…

Optics · Physics 2016-09-08 Jose M. Diazdelacruz

Although several optical techniques have been recently developed in order to overcome the resolution limit in microscopy, the imaging of sub-wavelength features is still a real challenge. In practise, super-resolution techniques remain…

Physics Education · Physics 2019-07-24 Stephane Perrin , Keshia Badu , Paul Montgomery , Sylvain Lecler

Speckle photography can be used to monitor deformations of solid surfaces. The measuring characteristics, such as range or lateral resolution depend heavily on the optical recording and illumination set-up. This paper shows how, by the…

Optics · Physics 2014-01-30 Jose M. Diazdelacruz

Optical spectroscopy techniques such as differential reflectance and transmittance have proven to be very powerful techniques to study 2D materials. However, a thorough description of the experimental setups needed to carry out these…

We demonstrate a new versatile method for 3D super-resolution microscopy by using a deformable mirror to shape the point spread function of our microscope in a continuous and controllable way. We apply this for 3D STORM imaging of…

Optics · Physics 2014-01-07 Nicolas Piro , Thomas Pengo , Nicolas Olivier , Suliana Manley

The displacement field of an object surface can be measured by using speckle interferometry. This technique is based on the phenomenon of laser speckle and consists in correlating speckle interferograms taken after and before the…

Applied Physics · Physics 2019-03-26 Andrés E. Dolinko , Gustavo E. Galizzi

One-shot full-field surface profilometry using digital diffractive-confocal imaging correlation microscope based on digital micromirror device is developed for one-shot microscopic 3D surface measurement. Optical configuration applies…

Optics · Physics 2019-04-24 Duc Trung Nguyen , Liang-Chia Chen , Nguyen Dinh Nguyen

We present a new imaging technique, swept-angle synthetic wavelength interferometry, for full-field micron-scale 3D sensing. As in conventional synthetic wavelength interferometry, our technique uses light consisting of two…

Computer Vision and Pattern Recognition · Computer Science 2023-03-31 Alankar Kotwal , Anat Levin , Ioannis Gkioulekas

A simple method of constructing the 3D surface of non-transparent micro-objects by extending the depth-of-field on the whole attainable surface is presented. The series of images of a sample are recorded by the sequential movement of the…

Instrumentation and Detectors · Physics 2009-04-15 V. V. Berejnov

We theorize the surface step characterization by reflected incoherent-light differential interference microscopy with consideration of the optical diffraction effect. With the integration of localization analysis, we develop a quantitative…

Optics · Physics 2022-11-30 Ka Hung Chan , Shengwang Du , Xian Chen

Spectroscopic ellipsometry is a widely used optical technique both in industry and research for determining the optical properties and thickness of thin films. The effective use of spectroscopic ellipsometry on micro-structures is inhibited…

Optics · Physics 2023-02-28 Ralfy Kenaz , Ronen Rapaport
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