Related papers: Dual-Frequency Resonance-Tracking Atomic Force Mic…
Force sensors are at the heart of different technologies such as atomic force microscopy or inertial sensing \cite{RMPforce2003, Rugar2004, YazdiIEEE}. These sensors often rely on the measurement of the displacement amplitude of mechanical…
We propose a two-frequency driving scheme in dynamic atomic force microscopy that maximizes the interaction time between tip and sample. Using a stochastic description of the cantilever dynamics, we predict large classical squeezing and a…
Nonlinear mechanical resonators display rich and complex dynamics and are important in many areas of fundamental and applied sciences. In this letter, we show that a particle confined in a funnel-shaped potential features a Duffing-type…
Trapped vortices in superconductors introduce residual resistance in superconducting radio-frequency (SRF) cavities and disrupt the operation of superconducting quantum and digital electronic circuits. Understanding the detailed dynamics of…
Fourier ptychography microscopy (FPM), sharing its roots with synthetic aperture technique and phase retrieval method, is a recently developed computational microscopic super-resolution technique. By turning on the light-emitting diode…
The sensitivity of mechanical resonators to physical quantities such as acceleration, pressure, mass and temperature enables them to underpin sensing and metrology applications. Here, we observe that the resonance frequency of a…
Nowadays, silicon micro-cantilevers with different geometrical shapes are widely used as micro-electro-mechanical systems and, more recently, as force sensor probes in atomic force microscopy (AFM). During the last ten years, several…
This research is on the nonlinear dynamics of a two-sided electrostatically actuated capacitive micro-beam. The microresonator is composed of silicon and PZT as a piezoelectric material. PZT is functionally distributed along the height of…
Microwave-induced nonlinear magnetoresistance in a dc-driven two-dimensional electron system is examined using a multi-photon-assisted transport scheme direct controlled by the current. It is shown that near the 2nd subharmonic of the…
Atomic Force Microscopy (AFM) allows to probe matter at atomic scale by measuring the perturbation of a nanomechanical oscillator induced by near-field interaction forces. The quest to improve sensitivity and resolution of AFM has forced…
We examine the mechanical eigenmodes of a quartz tuning fork (QTF) for the purpose of facilitat- ing its use as a probe for multi-frequency atomic force microscopy (AFM). We perform simulations based on the three-dimensional finite element…
The functionalization of an Atomic Force Microscope (AFM) cantilever with a colloidal bead is a widely used technique when the geometry between the probe and the sample must be controlled, particularly in force spectroscopy. But some…
Ferromagnetic Resonance Force Microscopy (FMRFM) offers a means of performing local ferromagnetic resonance. We have studied the evolution of the FMRFM force spectra in a continuous 50 nm thick permalloy film as a function of probe-film…
In single spin Magnetic Resonance Force Microscopy (MRFM), the objective is to detect the presence of an electron (or nuclear) spin in a sample volume by measuring spin-induced attonewton forces using a micromachined cantilever. In the…
Intermodulation atomic force microscopy (ImAFM) is a mode of dynamic atomic force microscopy that probes the nonlinear tip-surface force by measurement of the mixing of multiple tones in a frequency comb. A high $Q$ cantilever resonance and…
We present an alternative approach to pump-probe spectroscopy for measuring fast charge dynamics with an atomic force microscope (AFM). Our approach is based on coherent multifrequency lock-in measurement of the intermodulation between a…
Currently, Atomic Force Microscopy (AFM) is the most preferred Scanning Probe Microscopy (SPM) method due to its numerous advantages. However, increasing the scanning speed and reducing the interaction forces between the probe's tip and the…
We propose a method to observe phase-dependent spectra in resonance fluorescence, employing a two-level atom driven by a strong coherent field and a weak, amplitude-fluctuating field. The spectra are similar to those which occur in a…
Fluorescence-detected Fourier transform (FT) spectroscopy is a technique in which the relative paths of an optical interferometer are controlled to excite a material sample, and the ensuing fluorescence is detected as a function of the…
Atomic force microscopy (AFM) is an analytical surface characterization tool which can reveal a sample's topography with high spatial resolution while simultaneously probing tip-sample interactions. Local measurement of chemical properties…