English

Eigenmodes of a quartz tuning fork and their application to photo-induced force microscopy

Instrumentation and Detectors 2017-03-08 v1 Optics

Abstract

We examine the mechanical eigenmodes of a quartz tuning fork (QTF) for the purpose of facilitat- ing its use as a probe for multi-frequency atomic force microscopy (AFM). We perform simulations based on the three-dimensional finite element method (FEM) and compare the observed motions of the beams with experimentally measured resonance frequencies of two QTF systems. The com- parison enabled us to assign the first seven asymmetric eigenmodes of the QTF. We also find that a modified version of single beam theory can be used to guide the assignment of mechanical eigen- modes of QTFs. The usefulness of the QTF for multi-frequency AFM measurements is demonstrated through photo-induced force microscopy (PiFM) measurements. By using the QTF in different con- figurations, we show that the vectorial components of the photo-induced force can be independently assessed, and that lateral forces can be probed in true non-contact mode.

Keywords

Cite

@article{arxiv.1612.07253,
  title  = {Eigenmodes of a quartz tuning fork and their application to photo-induced force microscopy},
  author = {Bongsu Kim and Junghoon Jahng and Ryan Muhammad Khan and Sung Park and Eric O. Potma},
  journal= {arXiv preprint arXiv:1612.07253},
  year   = {2017}
}