X-ray Near Field Speckle: Implementation and Critical Analysis
Abstract
We have implemented the newly-introduced, coherence-based technique of x-ray near-field speckle (XNFS) at 8-ID-I at the Advanced Photon Source. In the near field regime of high-brilliance synchrotron x-rays scattered from a sample of interest, it turns out, that, when the scattered radiation and the main beam both impinge upon an x-ray area detector, the measured intensity shows low-contrast speckles, resulting from interference between the incident and scattered beams. We built a micrometer-resolution XNFS detector with a high numerical aperture microscope objective and demonstrate its capability for studying static structures and dynamics at longer length scales than traditional far field x-ray scattering techniques. Specifically, we characterized the structure and dynamics of dilute silica and polystyrene colloidal samples. Our study reveals certain limitations of the XNFS technique, which we discuss.
Cite
@article{arxiv.1102.3115,
title = {X-ray Near Field Speckle: Implementation and Critical Analysis},
author = {Xinhui Lu and Simon GJ Mochrie and S. Narayanan and A. R. Sandy and M. Sprung},
journal= {arXiv preprint arXiv:1102.3115},
year = {2011}
}
Comments
53 pages, 16 figures