The electric field-dependence of structural dynamics in a tetragonal ferroelectric lead zirconate titanate thin film is investigated under sub-coercive and above-coercive fields using time-resolved X-ray diffraction. During the application of an external field to the pre-poled thin film capacitor, structural signatures of domain nucleation and growth include broadening of the in-plane peak width of a Bragg reflection concomitant with a decrease of the peak intensity. This disordered domain state is remanent and can be erased with an appropriate voltage pulse sequence.
@article{arxiv.1812.01740,
title = {Time-resolved X-ray diffraction study of the structural dynamics in a ferroelectric thin film induced by sub-coercive fields},
author = {C. Kwamen and M. Rössle and W. Leitenberger and M. Alexe and M. Bargheer},
journal= {arXiv preprint arXiv:1812.01740},
year = {2019}
}