We present a segregrated strain model that describes the thickness-dependent dielectric properties of ferroelectric films. Using a phenomenological Landau approach, we present results for two specific materials, making comparison with experiment and with first-principles calculations whenever possible. We also suggest a "smoking gun" benchtop probe to test our elastic scenario.
@article{arxiv.0704.2752,
title = {Modelling Thickness-Dependence of Ferroelectric Thin Film Properties},
author = {L. Palova and P. Chandra and K. M. Rabe},
journal= {arXiv preprint arXiv:0704.2752},
year = {2007}
}