Crystallography under external electric field
Abstract
Structural response of crystals to an applied external perturbation is important as a key for understanding microscopic origin of physical properties. Experimental investigation of structural response is a great challenge for modern structure analysis. We demonstrate how advanced X-ray diffraction techniques facilitate probing tiny (10-4 {\AA}) distortions of bond lengths under a permanent electric field. We also discuss details of the experimental procedure essential for reaching such precision. We ask whether the experiment can be used to evaluate chemical bonds in crystals by their sensitivity to an external electric field and discuss if the bond deformations can be predicted using the bond-valence model or the Bader's theory of atoms in molecules and crystals. Finally, we describe the new time-resolved studies of a structural response to a dynamical switch of applied electric field. These results give access to the time-lining of piezoelectric effect on a microsecond time scale.
Cite
@article{arxiv.1303.7147,
title = {Crystallography under external electric field},
author = {Semen Gorfman and Oleg Schmidt and Vladimir Tsirelson and Michael Ziolkowski and Ullrich Pietsch},
journal= {arXiv preprint arXiv:1303.7147},
year = {2016}
}
Comments
10 pages, 10 figures