We measure the remnant polarization of ferroelectric domains in BiFeO3 films down to 3.6 nm using low energy electron and photoelectron emission microscopy. The measured polarization decays strongly below a critical thickness of 5-7 nm predicted by continuous medium theory whereas the tetragonal distortion does not change. We resolve this apparent contradiction using first-principles-based effective Hamiltonian calculations. In ultra thin films the energetics of near open circuit electrical boundary conditions, i.e. unscreened depolarizing field, drive the system through a phase transition from single out-of-plane polarization to a nanoscale stripe domains, giving rise to an average remnant polarization close to zero as measured by the electron microscopy whilst maintaining the relatively large tetragonal distortion imposed by the non-zero polarization state of each individual domain.
@article{arxiv.1210.3806,
title = {Thickness-dependent polarization of strained BiFeO3 films with constant tetragonality},
author = {J. E. Rault and W. Ren and S. Prosandeev and S. Lisenkov and D. Sando and S. Fusil and M. Bibes and A. Barthelemy and L. Bellaiche and N. Barrett},
journal= {arXiv preprint arXiv:1210.3806},
year = {2013}
}
Comments
main article: 5 pages, 6 figures; supplementary materials: 6 pages, 6 figures. Published in Phys. Rev. Lett