Nanoscale switching characteristics of nearly tetragonal BiFeO3 thin films

Dipanjan Mazumdar; Vilas Shelke; Milko Iliev; Stephen Jesse; Amit Kumar; Sergei Kalinin; Arthur Baddorf; Arunava Gupta

doi:10.1021/nl101187a

Nanoscale switching characteristics of nearly tetragonal BiFeO3 thin films

Materials Science 2015-05-18 v1

Authors: Dipanjan Mazumdar , Vilas Shelke , Milko Iliev , Stephen Jesse , Amit Kumar , Sergei Kalinin , Arthur Baddorf , Arunava Gupta

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Abstract

We have investigated the nanoscale switching properties of strain-engineered BiFeO3 thin films deposited on LaAlO3 substrates using a combination of scanning probe techniques. Polarized Raman spectral analysis indicate that the nearly-tetragonal films have monoclinic (Cc) rather than P4mm tetragonal symmetry. Through local switching-spectroscopy measurements and piezoresponse force microscopy we provide clear evidence of ferroelectric switching of the tetragonal phase but the polarization direction, and therefore its switching, deviates strongly from the expected (001) tetragonal axis. We also demonstrate a large and reversible, electrically-driven structural phase transition from the tetragonal to the rhombohedral polymorph in this material which is promising for a plethora of applications.

Keywords

BiFeO3 thin films ferroelectric switching scanning probe microscopy strain engineering structural phase transition piezoresponse force microscopy

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@article{arxiv.1004.2052,
  title  = {Nanoscale switching characteristics of nearly tetragonal BiFeO3 thin films},
  author = {Dipanjan Mazumdar and Vilas Shelke and Milko Iliev and Stephen Jesse and Amit Kumar and Sergei Kalinin and Arthur Baddorf and Arunava Gupta},
  journal= {arXiv preprint arXiv:1004.2052},
  year   = {2015}
}

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10 pages, 6 figures

Nanoscale switching characteristics of nearly tetragonal BiFeO3 thin films

Abstract

Keywords

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