Polarized Raman spectroscopy of nearly-tetragonal BiFeO$_3$ thin films

M. N. Iliev; M. V. Abrashev; D. Mazumdar; V. Shelke; A. Gupta

doi:10.1103/PhysRevB.82.014107

Polarized Raman spectroscopy of nearly-tetragonal BiFeO$_3$ thin films

Materials Science 2015-05-18 v1 Mesoscale and Nanoscale Physics Strongly Correlated Electrons

Authors: M. N. Iliev , M. V. Abrashev , D. Mazumdar , V. Shelke , A. Gupta

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Abstract

BiFeO $_3$ thin films can be epitaxially stabilized in a nearly-tetragonal phase under a high biaxial compressive strain. Here we investigate the polarized Raman spectra of constrained BiFeO $_3$ films with tetragonal-like (BFO-T), rhombohedral-like (BFO-R) and multiphase (BFO-T+R) structure. Based on analysis of the number and symmetry of the Raman lines, we provide strong experimental evidence that the nearly-tetragonal films are monoclinic ( $Cc$ symmetry) and not tetragonal $(P4mm)$ . Through the Raman mapping technique we show localized coexistence of BFO-T and BFO-R phases with the relative fraction dependent on the film thickness.

Keywords

bismuth ferrite thin films polarized raman spectroscopy nearly-tetragonal phase monoclinic symmetry phase coexistence epitaxial strain

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@article{arxiv.1003.2828,
  title  = {Polarized Raman spectroscopy of nearly-tetragonal BiFeO$_3$ thin films},
  author = {M. N. Iliev and M. V. Abrashev and D. Mazumdar and V. Shelke and A. Gupta},
  journal= {arXiv preprint arXiv:1003.2828},
  year   = {2015}
}

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4 pages, 4 figures, 1 table

Polarized Raman spectroscopy of nearly-tetragonal BiFeO$_3$ thin films

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