Thickness characterization of atomically-thin WSe$_2$ on epitaxial graphene by low-energy electron reflectivity oscillations

Sergio C. de la Barrera; Yu-Chuan Lin; Sarah M. Eichfeld; Joshua A. Robinson; Qin Gao; Michael Widom; Randall M. Feenstra

doi:10.1116/1.4954642

Thickness characterization of atomically-thin WSe$_2$ on epitaxial graphene by low-energy electron reflectivity oscillations

Mesoscale and Nanoscale Physics 2017-09-22 v1

Authors: Sergio C. de la Barrera , Yu-Chuan Lin , Sarah M. Eichfeld , Joshua A. Robinson , Qin Gao , Michael Widom , Randall M. Feenstra

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Abstract

In this work, low-energy electron microscopy is employed to probe structural as well as electronic information in few-layer WSe $_2$ on epitaxial graphene on SiC. The emergence of unoccupied states in the WSe $_2$ --graphene heterostructures are studied using spectroscopic low-energy electron reflectivity. Reflectivity minima corresponding to specific WSe $_2$ states that are localized between the monolayers of each vertical heterostructure are shown to reveal the number of layers for each point on the surface. A theory for the origin of these states is developed and utilized to explain the experimentally observed featured in the WSe $_2$ electron reflectivity.

Keywords

WSe2 epitaxial graphene low-energy electron microscopy electron reflectivity thickness characterization

Cite

@article{arxiv.1606.04167,
  title  = {Thickness characterization of atomically-thin WSe$_2$ on epitaxial graphene by low-energy electron reflectivity oscillations},
  author = {Sergio C. de la Barrera and Yu-Chuan Lin and Sarah M. Eichfeld and Joshua A. Robinson and Qin Gao and Michael Widom and Randall M. Feenstra},
  journal= {arXiv preprint arXiv:1606.04167},
  year   = {2017}
}

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15 pages, 7 figures

Thickness characterization of atomically-thin WSe$_2$ on epitaxial graphene by low-energy electron reflectivity oscillations

Abstract

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