English

Thermally stimulated H emission and diffusion in hydrogenated amorphous silicon

Materials Science 2009-11-11 v2

Abstract

We report first principles ab initio density functional calculations of hydrogen dynam- ics in hydrogenated amorphous silicon. Thermal motion of the host Si atoms drives H diffusion, as we demonstrate by direct simulation and explain with simple models. Si-Si bond centers and Si ring centers are local energy minima as expected. We also describe a new mechanism for break- ing Si-H bonds to release free atomic H into the network: a fluctuation bond center detachment (FBCD) assisted diffusion. H dynamics in a-Si:H is dominated by structural fluctuations intrinsic to the amorphous phase not present in the crystal.

Keywords

Cite

@article{arxiv.cond-mat/0611375,
  title  = {Thermally stimulated H emission and diffusion in hydrogenated amorphous silicon},
  author = {T. A. Abtew and F. Inam and D. A. Drabold},
  journal= {arXiv preprint arXiv:cond-mat/0611375},
  year   = {2009}
}

Comments

4 pages, 5 figures, In press EPL (Jun. 2007)