Study of delamination in REBCO coated conductor by transmission electron microscopy

Yan Xin; Jun Lu; Ke Han

Study of delamination in REBCO coated conductor by transmission electron microscopy

Superconductivity 2024-10-16 v1

Authors: Yan Xin , Jun Lu , Ke Han

Abstract

Delamination strength of REBCO is very important for its applications in large magnet projects. This work presented the transmission electron microscopy (TEM) investigation of the microstructures of the REBCO coated conductor to understand its delamination property. We found that the low delamination strength is associated with nano-voids formed at the IBAD MgO/Y2O3 interface.

Keywords

REBCO coated conductor delamination transmission electron microscopy nano-voids IBAD MgO/Y2O3 interface

Cite

@article{arxiv.2410.11556,
  title  = {Study of delamination in REBCO coated conductor by transmission electron microscopy},
  author = {Yan Xin and Jun Lu and Ke Han},
  journal= {arXiv preprint arXiv:2410.11556},
  year   = {2024}
}

Comments

ASC2024 conference, Sept. 2-6, 2024, Salt Lake City, UT

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