Structure retrieval at atomic resolution in the presence of multiple scattering of the electron probe
Materials Science
2019-01-02 v1
Abstract
The projected electrostatic potential of a thick crystal is reconstructed at atomic-resolution from experimental scanning transmission electron microscopy data recorded using a new generation fast- readout electron camera. This practical and deterministic inversion of the equations encapsulating multiple scattering that were written down by Bethe in 1928 removes the restriction of established methods to ultrathin ( {\AA}) samples. Instruments already coming on-line can overcome the remaining resolution-limiting effects in this method due to finite probe-forming aperture size, spatial incoherence and residual lens aberrations.
Keywords
Cite
@article{arxiv.1809.09926,
title = {Structure retrieval at atomic resolution in the presence of multiple scattering of the electron probe},
author = {Hamish G. Brown and Zhen Chen and Matthew Weyland and Colin Ophus and Jim Ciston and Les J. Allen and Scott D. Findlay},
journal= {arXiv preprint arXiv:1809.09926},
year = {2019}
}
Comments
6 pages, 3 figures