In the context of fast developing quantum technologies, locating single quantum objects embedded in solid or fluid environment while keeping their properties unchanged is a crucial requirement as well as a challenge. Such "quantum microscopes" have been demonstrated already for NV-centers embedded in diamond [1], and for single atoms within an ultracold gas [2]. In this work, we demonstrate a new method to determine non-destructively the position of randomly distributed semiconductor quantum dots (QDs) deeply embedded in a solid photonic waveguide. By setting the wire in an oscillating motion, we generate large stress gradients across the QDs plane. We then exploit the fact that the QDs emission frequency is highly sensitive to the local material stress [3-5] to infer their positions with an accuracy ranging from +/- 35 nm down to +/-1 nm for close-to-axis QDs.
@article{arxiv.1607.06277,
title = {Strain-gradient mapping of semiconductor quantum dots},
author = {P. -L De Assis and I Yeo and A Gloppe and H. A. Nguyen and D Tumanov and E Dupont-Ferrier and N. S. Malik and E Dupuy and J Claudon and J. -M Gérard and Alexia Auffèves and O Arcizet and Maxime Richard and J. -Ph Poizat},
journal= {arXiv preprint arXiv:1607.06277},
year = {2017}
}