This paper has been withdrawn by the authors. The 3D distribution of self-assembled stacked quantum dots (QDs) is a key parameter to obtain the highest performance in a variety of optoelectronic devices. In this work, we have measured this distribution in 3D using a combined procedure of needle-shape specimen preparation and electron tomography. We show that conventional 2D measurements of the distribution of QDs are not reliable, and only a 3D analysis allows an accurate correlation between the growth design and the structural characteristics.
@article{arxiv.1209.0892,
title = {Analysis of the 3D distribution of self-assembled stacked quantum dots by electron tomography},
author = {Jesús Hernández-Saz and Miriam Herrera and Diego Alonso-Álvarez and Sergio I. Molina},
journal= {arXiv preprint arXiv:1209.0892},
year = {2012}
}