Signals induced by charge-trapping in EDELWEISS FID detectors: analytical modeling and applications
Abstract
The EDELWEISS-III direct dark matter search experiment uses cryogenic HP-Ge detectors Fully covered with Inter-Digitized electrodes (FID). They are operated at low fields (), and as a consequence charge-carrier trapping significantly affects both the ionization and heat energy measurements. This paper describes an analytical model of the signals induced by trapped charges in FID detectors based on the Shockley-Ramo theorem. It is used to demonstrate that veto electrodes, initially designed for the sole purpose of surface event rejection, can be used to provide a sensitivity to the depth of the energy deposits, characterize the trapping in the crystals, perform heat and ionization energy corrections and improve the ionization baseline resolutions. These procedures are applied successfully to actual data.
Keywords
Cite
@article{arxiv.1606.08097,
title = {Signals induced by charge-trapping in EDELWEISS FID detectors: analytical modeling and applications},
author = {The EDELWEISS Collaboration and Q. Arnaud and E. Armengaud and C. Augier and A. Benoît and L. Bergé and J. Billard and J. Blümer and T. de Boissière and A. Broniatowski and P. Camus and A. Cazes and M. Chapellier and F. Charlieux and L. Dumoulin and K. Eitel and N. Foerster and N. Fourches and J. Gascon and A. Giuliani and M. Gros and L. Hehn and G. Heuermann and M. De Jésus and Y. Jin and A. Juillard and M. Kleifges and V. Kozlov and H. Kraus and C. Kéfélian and V. A. Kudryavtsev and H. Le-Sueur and S. Marnieros and X. -F. Navick and C. Nones and E. Olivieri and P. Pari and B. Paul and M. -C. Piro and D. Poda and E. Queguiner and S. Rozov and V. Sanglard and B. Schmidt and S. Scorza and B. Siebenborn and D. Tcherniakhovski and L. Vagneron and M. Weber and E. Yakushev},
journal= {arXiv preprint arXiv:1606.08097},
year = {2016}
}
Comments
17 pages 12 figures, submitted to JINST, author list updated