Modeling of Impact Ionization and Charge Trapping in SuperCDMS HVeV Detectors

F. Ponce; W. Page; P. L. Brink; B. Cabrera; M. Cherry; C. Fink; N. Kurinsky; R. Partridge; M. Pyle; B. Sadoulet; B. Serfass; C. Stanford; S. L. Watkins; S. Yellin; B. A. Young

doi:10.1007/s10909-020-02349-x

Modeling of Impact Ionization and Charge Trapping in SuperCDMS HVeV Detectors

Instrumentation and Detectors 2020-02-17 v1

Authors: F. Ponce , W. Page , P. L. Brink , B. Cabrera , M. Cherry , C. Fink , N. Kurinsky , R. Partridge , M. Pyle , B. Sadoulet , B. Serfass , C. Stanford , S. L. Watkins , S. Yellin , B. A. Young

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Abstract

A model for charge trapping and impact ionization, and an experiment to measure these parameters is presented for the SuperCDMS HVeV detector. A procedure to isolate and quantify the main sources of noise (bulk and surface charge leakage) in the measurements is also describe. This sets the stage to precisely measure the charge trapping and impact ionization probabilities in order to incorporate this model into future dark matter searches.

Keywords

charge trapping impact ionization supercdms hvev detector noise sources dark matter searches

Cite

@article{arxiv.1912.11549,
  title  = {Modeling of Impact Ionization and Charge Trapping in SuperCDMS HVeV Detectors},
  author = {F. Ponce and W. Page and P. L. Brink and B. Cabrera and M. Cherry and C. Fink and N. Kurinsky and R. Partridge and M. Pyle and B. Sadoulet and B. Serfass and C. Stanford and S. L. Watkins and S. Yellin and B. A. Young},
  journal= {arXiv preprint arXiv:1912.11549},
  year   = {2020}
}

Modeling of Impact Ionization and Charge Trapping in SuperCDMS HVeV Detectors

Abstract

Keywords

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