Robust surface electronic properties of topological insulators: Bi2Te3 films grown by molecular beam epitaxy

L. Plucinski; G. Mussler; J. Krumrain; S. Suga; D. Gruetzmacher; C. M. Schneider

doi:10.1063/1.3595309

Robust surface electronic properties of topological insulators: Bi2Te3 films grown by molecular beam epitaxy

Materials Science 2015-05-27 v2 Quantum Gases Strongly Correlated Electrons

Authors: L. Plucinski , G. Mussler , J. Krumrain , S. Suga , D. Gruetzmacher , C. M. Schneider

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Abstract

The surface electronic properties of the important topological insulator Bi2Te3 are shown to be robust under an extended surface preparation procedure which includes exposure to atmosphere and subsequent cleaning and recrystallization by an optimized in-situ sputter-anneal procedure under ultra high vacuum conditions. Clear Dirac-cone features are displayed in high-resolution angle-resolved photoemission spectra from the resulting samples, indicating remarkable insensitivity of the topological surface state to cleaning-induced surface roughness.

Keywords

topological insulator Bi2Te3 surface electronic properties molecular beam epitaxy angle-resolved photoemission Dirac cone

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@article{arxiv.1103.4548,
  title  = {Robust surface electronic properties of topological insulators: Bi2Te3 films grown by molecular beam epitaxy},
  author = {L. Plucinski and G. Mussler and J. Krumrain and S. Suga and D. Gruetzmacher and C. M. Schneider},
  journal= {arXiv preprint arXiv:1103.4548},
  year   = {2015}
}

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3 pages, 3 figures

Robust surface electronic properties of topological insulators: Bi2Te3 films grown by molecular beam epitaxy

Abstract

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