English

ReMP: Rectified Metric Propagation for Few-Shot Learning

Computer Vision and Pattern Recognition 2020-12-03 v1 Machine Learning

Abstract

Few-shot learning features the capability of generalizing from a few examples. In this paper, we first identify that a discriminative feature space, namely a rectified metric space, that is learned to maintain the metric consistency from training to testing, is an essential component to the success of metric-based few-shot learning. Numerous analyses indicate that a simple modification of the objective can yield substantial performance gains. The resulting approach, called rectified metric propagation (ReMP), further optimizes an attentive prototype propagation network, and applies a repulsive force to make confident predictions. Extensive experiments demonstrate that the proposed ReMP is effective and efficient, and outperforms the state of the arts on various standard few-shot learning datasets.

Keywords

Cite

@article{arxiv.2012.00904,
  title  = {ReMP: Rectified Metric Propagation for Few-Shot Learning},
  author = {Yang Zhao and Chunyuan Li and Ping Yu and Changyou Chen},
  journal= {arXiv preprint arXiv:2012.00904},
  year   = {2020}
}

Comments

Tech Report, 11 pages

R2 v1 2026-06-23T20:39:29.937Z