Random telegraph noise in metallic single-walled carbon nanotubes

Hyun-Jong Chung; Tae Woo Uhm; Sung Won Kim; Young Gyu You; Sang Wook Lee; Sung Ho Jhang; Eleanor E. B. Campbell; Yung Woo Park

doi:10.1063/1.4876443

Random telegraph noise in metallic single-walled carbon nanotubes

Mesoscale and Nanoscale Physics 2014-05-15 v1

Authors: Hyun-Jong Chung , Tae Woo Uhm , Sung Won Kim , Young Gyu You , Sang Wook Lee , Sung Ho Jhang , Eleanor E. B. Campbell , Yung Woo Park

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Abstract

We have investigated random telegraph noise (RTN) observed in individual metallic carbon nanotubes (CNTs). Mean lifetimes in high- and low-current states, shigh and slow, have been studied as a function of bias-voltage and gate-voltage as well as temperature. By analyzing the statistics and features of the RTN, we suggest that this noise is due to the random transition of defects between two metastable states, activated by inelastic scattering with conduction electrons. Our results indicate an important role of defect motions in the 1=f noise in CNTs.

Keywords

random telegraph noise metallic carbon nanotubes defect transitions 1/f noise inelastic scattering mean lifetimes

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@article{arxiv.1405.3398,
  title  = {Random telegraph noise in metallic single-walled carbon nanotubes},
  author = {Hyun-Jong Chung and Tae Woo Uhm and Sung Won Kim and Young Gyu You and Sang Wook Lee and Sung Ho Jhang and Eleanor E. B. Campbell and Yung Woo Park},
  journal= {arXiv preprint arXiv:1405.3398},
  year   = {2014}
}

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4 pages

Random telegraph noise in metallic single-walled carbon nanotubes

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